Inventor · disambiguated record
Naomi M. Jenkins
Also filed as: JENKINS NAOMI M
7 granted patents·1 pending application·156 citations·filing 2002–2003
87Inventor score
Files withADVANCED MICRO DEVICES INC7
Top patents by PatentIndex Score
8 records- 0189US6778873B1Identifying a cause of a fault based on a process controller outputADVANCED MICRO DEVICES INC·Filed 2002·Granted Aug 17, 2004·56 cites·27 claims
- 0282US6740534B1Determination of a process flow based upon fault detection analysisADVANCED MICRO DEVICES INC·Filed 2002·Granted May 25, 2004·34 cites·16 claims
- 0378US6834213B1Process control based upon a metrology delayADVANCED MICRO DEVICES INC·Filed 2003·Granted Dec 21, 2004·25 cites·29 claims
- 0475US7031793B1Conflict resolution among multiple controllersADVANCED MICRO DEVICES INC·Filed 2002·Granted Apr 18, 2006·20 cites·24 claims
- 0568US6925347B1Process control based on an estimated process resultADVANCED MICRO DEVICES INC·Filed 2002·Granted Aug 2, 2005·13 cites·29 claims
- 0654US6947805B1Dynamic metrology sampling techniques for identified lots, and system for performing sameADVANCED MICRO DEVICES INC·Filed 2003·Granted Sep 20, 2005·5 cites·24 claims
- 0752US7581140B1Initiating test runs based on fault detection resultsADVANCED MICRO DEVICES INC·Filed 2002·Granted Aug 25, 2009·3 cites·19 claims
- 0835US2005021272A1Method and apparatus for performing metrology dispatching based upon fault detectionFiled 2003·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →