Inventor · disambiguated record
Naoki Kai
Also filed as: KAI NAOKI
10 granted patents·8 pending applications·42 citations·filing 2000–2024
84Inventor score
Top patents by PatentIndex Score
18 records- 0183US7196370B2Nonvolatile semiconductor memory device having trench-type isolation region, and method of fabricating the sameTOSHIBA KK·Filed 2004·Granted Mar 27, 2007·27 cites·19 claims
- 0279US10607724B2Information processing apparatus and method for clinical laboratory managementSYSMEX CORP·Filed 2016·Granted Mar 31, 2020·4 cites·33 claims
- 0378US9082866B2Semiconductor storage device and method of manufacturing the sameTOSHIBA KK·Filed 2013·Granted Jul 14, 2015·5 cites·12 claims
- 0464US2025081435A1Semiconductor deviceKIOXIA CORP·Filed 2024·Application pending·0 cites
- 0561US11894110B2Information processing apparatus and method for clinical laboratory managementSYSMEX CORP·Filed 2020·Granted Feb 6, 2024·0 cites·28 claims
- 0661US11881290B2Information processing apparatus and method for clinical laboratory managementSYSMEX CORP·Filed 2020·Granted Jan 23, 2024·0 cites·26 claims
- 0756US9006812B2Nonvolatile semiconductor memory device and method for manufacturing the sameTOSHIBA KK·Filed 2013·Granted Apr 14, 2015·1 cites·10 claims
- 0856US7651924B2Method of fabricating semiconductor memory device in which an oxide film fills a trench in a semiconductor substrateTOSHIBA KK·Filed 2008·Granted Jan 26, 2010·0 cites·9 claims
- 0955US2010105189A1Method of fabricating semiconductor memory deviceTOSHIBA KK·Filed 2009·Application pending·0 cites
- 1054US2024099027A1Nonvolatile semiconductor storage device and manufacturing methodKIOXIA CORP·Filed 2023·Application pending·0 cites
- 1153US6759314B1Method for manufacturing semiconductor devices using thermal nitride films as gate insulating filmsTOSHIBA KK·Filed 2000·Granted Jul 6, 2004·5 cites·15 claims
- 1244US10570990B2Endless flat belt and method for manufacturing the sameNITTA CORP·Filed 2015·Granted Feb 25, 2020·0 cites·9 claims
- 1342US8466935B2Gamma corrector with a storage capacity for gamma correction data reducedKAI NAOKI·Filed 2008·Granted Jun 18, 2013·0 cites·5 claims
- 1441US2013248970A1Nonvolatile semiconductor storage device and method of manufacturing the sameTOSHIBA KK·Filed 2013·Application pending·0 cites
- 1540US2015069569A1Semiconductor memory device and method for manufacturing sameTOSHIBA KK·Filed 2014·Application pending·0 cites
- 1638US2012126306A1Nonvolatile semiconductor memory device and manufacturing method of nonvolatile semiconductor memory deviceKAWAGUCHI GENKI·Filed 2011·Application pending·0 cites
- 1736US2014284676A1Semiconductor memory device and manufacturing method thereofTOSHIBA KK·Filed 2013·Application pending·0 cites
- 1831US2012132985A1Non-volatile semiconductor memory device and method of manufacturing non-volatile semiconductor memory deviceKAI NAOKI·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →