Inventor · disambiguated record
Naoki Kohara
Also filed as: KOHARA NAOKI
22 granted patents·2 pending applications·323 citations·filing 1994–2022
95Inventor score
Files withMATSUSHITA ELECTRIC INDUSTRIAL CO LTD10CANON KK5CANON USA INC2PANASONIC IP MAN CO LTD2KOHARA NAOKI1
Top patents by PatentIndex Score
24 records- 0191US5858121AThin film solar cell and method for manufacturing the sameMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1996·Granted Jan 12, 1999·75 cites·9 claims
- 0285US6212057B1Flexible thin film capacitor having an adhesive filmMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1999·Granted Apr 3, 2001·55 cites·14 claims
- 0383US8831174B2X-ray imaging method and X-ray imaging apparatusKOHARA NAOKI·Filed 2011·Granted Sep 9, 2014·31 cites·7 claims
- 0482US9107637B2X-ray imaging apparatus and wavefront measuring apparatusOUCHI CHIDANE·Filed 2011·Granted Aug 18, 2015·7 cites·14 claims
- 0582US6624462B1Dielectric film and method of fabricating the sameMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2000·Granted Sep 23, 2003·30 cites·4 claims
- 0679US7075960B2Semiconductor laser apparatus and production method thereofMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2004·Granted Jul 11, 2006·25 cites·13 claims
- 0776US10682044B2Spectrally encoded forward view and spectrally encoded multi-view endoscope using back-reflected light between reflective surfacesCANON USA INC·Filed 2018·Granted Jun 16, 2020·2 cites·26 claims
- 0875US6023020ASolar cell and method for manufacturing the sameMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1997·Granted Feb 8, 2000·45 cites·33 claims
- 0971US10809538B2Image acquisition apparatus, spectral apparatus, methods, and storage medium for use with sameCANON USA INC·Filed 2017·Granted Oct 20, 2020·1 cites·21 claims
- 1064US6974547B1Flexible thin film capacitor and method for producing the sameMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2000·Granted Dec 13, 2005·10 cites·17 claims
- 1162US7362785B2Semiconductor laser apparatus and production method thereofMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2006·Granted Apr 22, 2008·2 cites·4 claims
- 1261US7483467B2Semiconductor laser unit and method for manufacturing optical reflection filmPANASONIC CORP·Filed 2006·Granted Jan 27, 2009·2 cites·9 claims
- 1360US10302487B2Noise reduction apparatus and detection apparatus including the sameCANON KK·Filed 2018·Granted May 28, 2019·0 cites·26 claims
- 1458US10132681B2Noise reduction apparatus and detection apparatus including the sameCANON KK·Filed 2017·Granted Nov 20, 2018·0 cites·20 claims
- 1554US8520217B2Talbot interferometer, its adjustment method, and measurement methodNAOI TOSHIYUKI·Filed 2010·Granted Aug 27, 2013·2 cites·2 claims
- 1653US12510610B2Magnetic sensor and magnetic detection systemPANASONIC IP MAN CO LTD·Filed 2022·Granted Dec 30, 2025·0 cites·8 claims
- 1750US6162296AMethod and apparatus for manufacturing chalcopyrite semiconductor thin filmsMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1999·Granted Dec 19, 2000·13 cites·6 claims
- 1850US5500056ASolar cell containing low melting point glass layerMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1994·Granted Mar 19, 1996·14 cites·11 claims
- 1950US2024142550A1Magnetic sensor and method of manufacturing magnetic sensorPANASONIC HOLDINGS CORP·Filed 2022·Application pending·0 cites
- 2045US12385765B2Position detection systemPANASONIC IP MAN CO LTD·Filed 2021·Granted Aug 12, 2025·0 cites·8 claims
- 2145US9816932B2Pulsed light synchronizer and microscope systemCANON KK·Filed 2015·Granted Nov 14, 2017·0 cites·13 claims
- 2243US5918111AMethod and apparatus for manufacturing chalcopyrite semiconductor thin filmsMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1996·Granted Jun 29, 1999·9 cites·15 claims
- 2342US2013157202A1Apparatus, method, and talbot interferometer for calculating aberration of test optical systemCANON KK·Filed 2012·Application pending·0 cites
- 2440US10845583B2Scanning microscopeCANON KK·Filed 2016·Granted Nov 24, 2020·0 cites·18 claims
Join the waitlist — get patent alerts
Get an alert when Naoki Kohara files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →