Inventor · disambiguated record
Naoaki Kondo
Also filed as: KONDO NAOAKI
11 granted patents·4 pending applications·11 citations·filing 2016–2022
82Inventor score
Top patents by PatentIndex Score
15 records- 0187US12260545B2Sample observation device and methodHITACHI HIGH TECH CORP·Filed 2022·Granted Mar 25, 2025·1 cites·16 claims
- 0282US10810733B2Defect classification apparatus and defect classification methodHITACHI HIGH TECH CORP·Filed 2016·Granted Oct 20, 2020·5 cites·6 claims
- 0377US10559074B2Sample observation device and sample observation methodHITACHI HIGH TECH CORP·Filed 2018·Granted Feb 11, 2020·2 cites·16 claims
- 0473US11170483B2Sample observation device and sample observation methodHITACHI HIGH TECH CORP·Filed 2019·Granted Nov 9, 2021·1 cites·13 claims
- 0573US10971325B2Defect observation system and defect observation method for semiconductor waferHITACHI HIGH TECH CORP·Filed 2019·Granted Apr 6, 2021·1 cites·16 claims
- 0668US11087454B2Defect observation device and defect observation methodHITACHI HIGH TECH CORP·Filed 2017·Granted Aug 10, 2021·1 cites·9 claims
- 0757US12499532B2Computer and visual inspection method for identifying defective productsHITACHI LTD·Filed 2022·Granted Dec 16, 2025·0 cites·13 claims
- 0852US2025014166A1System, image processing method, and programHITACHI LTD·Filed 2022·Application pending·0 cites
- 0952US2025285261A1Sample observation methodHITACHI HIGH TECH CORP·Filed 2022·Application pending·0 cites
- 1052US2023013887A1Sample observation device, sample observation method, and computer systemHITACHI HIGH TECH CORP·Filed 2022·Application pending·0 cites
- 1151US12333695B2Sample observation system and image processing methodHITACHI HIGH TECH CORP·Filed 2021·Granted Jun 17, 2025·0 cites·19 claims
- 1251US2024273708A1Abnormality determination computer and abnormality determination methodHITACHI LTD·Filed 2022·Application pending·0 cites
- 1348US12154264B2Defect inspecting system and defect inspecting methodHITACHI HIGH TECH CORP·Filed 2019·Granted Nov 26, 2024·0 cites·9 claims
- 1445US11670528B2Wafer observation apparatus and wafer observation methodHITACHI HIGH TECH CORP·Filed 2020·Granted Jun 6, 2023·0 cites·10 claims
- 1544US10977786B2Wafer observation deviceHITACHI HIGH TECH CORP·Filed 2019·Granted Apr 13, 2021·0 cites·10 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →