Inventor · disambiguated record
Namil Koo
Also filed as: KOO NAMIL
10 granted patents·5 pending applications·7 citations·filing 2010–2023
79Inventor score
Top patents by PatentIndex Score
15 records- 0180US12165933B2Semiconductor substrate processing apparatus and semiconductor substrate measuring apparatus using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Dec 10, 2024·1 cites·20 claims
- 0274US10611937B2Composition for adhesion, stacked structure using the same, and electronic device using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2018·Granted Apr 7, 2020·2 cites·20 claims
- 0371US12474260B2Terahertz signal measuring apparatus and measuring methodSAMSUNG ELECTRONICS CO LTD·Filed 2023·Granted Nov 18, 2025·0 cites·20 claims
- 0467US2024399506A1Substrate processing apparatus and substrate processing method using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2023·Application pending·0 cites
- 0566US8795775B2Nanoimprint methodKOO NAMIL·Filed 2011·Granted Aug 5, 2014·4 cites·20 claims
- 0662US12474393B2Terahertz probeSAMSUNG ELECTRONICS CO LTD·Filed 2023·Granted Nov 18, 2025·0 cites·17 claims
- 0762US12469750B2Method of extracting properties of a layer on a waferSAMSUNG ELECTRONICS CO LTD·Filed 2023·Granted Nov 11, 2025·0 cites·20 claims
- 0861US11680898B2Hybrid probe, physical property analysis apparatus including the same, and method of measuring semiconductor device using the apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Jun 20, 2023·0 cites·17 claims
- 0955US11579168B2Probe for detecting near field and near-field detecting system including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Feb 14, 2023·0 cites·20 claims
- 1055US11579167B2Probe for detecting near field and near-field detection system including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Feb 14, 2023·0 cites·20 claims
- 1155US2024152058A1Immersion lithographic systemSAMSUNG ELECTRONICS CO LTD·Filed 2023·Application pending·0 cites
- 1252US2024019362A1Probe and inspection apparatus including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2023·Application pending·0 cites
- 1339US2021366102A1Inspection apparatus of waferSAMSUNG ELECTRONICS CO LTD·Filed 2020·Application pending·0 cites
- 1434US11688623B2Wafer inspection apparatusesSAMSUNG ELECTRONICS CO LTD·Filed 2020·Granted Jun 27, 2023·0 cites·15 claims
- 1522US2011298158A1Nanolithography processKOO NAMIL·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →