Inventor · disambiguated record
Natsuki Kushiyama
Also filed as: KUSHIYAMA NATSUKI
27 granted patents·5 pending applications·586 citations·filing 1988–2015
97Inventor score
Top patents by PatentIndex Score
32 records- 0199US7616075B2Phase locked loop circuit having regulatorTOSHIBA KK·Filed 2008·Granted Nov 10, 2009·103 cites·25 claims
- 0295US6163178AImpedance controlled output driverRAMBUS INC·Filed 1998·Granted Dec 19, 2000·95 cites·29 claims
- 0394US7091761B2Impedance controlled output driverRAMBUS INC·Filed 2005·Granted Aug 15, 2006·22 cites·18 claims
- 0490US6661268B2Charge compensation control circuit and method for use with output driverRAMBUS INC·Filed 2001·Granted Dec 9, 2003·30 cites·6 claims
- 0587US6498741B2Semiconductor memory deviceTOSHIBA KK·Filed 2000·Granted Dec 24, 2002·38 cites·20 claims
- 0681US6342800B1Charge compensation control circuit and method for use with output driverRAMBUS INC·Filed 2000·Granted Jan 29, 2002·17 cites·11 claims
- 0779US7251765B2Semiconductor integrated circuit and method for testing a semiconductor integrated circuitTOSHIBA KK·Filed 2004·Granted Jul 31, 2007·22 cites·18 claims
- 0878US5341326ASemiconductor memory having memory cell units each including cascade-connected MOS transistorsTOSHIBA KK·Filed 1992·Granted Aug 23, 1994·41 cites·43 claims
- 0977US5991218ADynamic random access memoryTOSHIBA KK·Filed 1998·Granted Nov 23, 1999·39 cites·22 claims
- 1076US7538369B2Resistance-change-type fuse circuitTOSHIBA KK·Filed 2007·Granted May 26, 2009·7 cites·18 claims
- 1175US7526049B2Data sampling circuit and semiconductor integrated circuitTOSHIBA KK·Filed 2006·Granted Apr 28, 2009·6 cites·20 claims
- 1273US5377152ASemiconductor memory and screening test method thereofTOSHIBA KK·Filed 1992·Granted Dec 27, 1994·25 cites·29 claims
- 1371US6198649B1Semiconductor memory deviceTOSHIBA KK·Filed 1999·Granted Mar 6, 2001·26 cites·13 claims
- 1469US5532963ASemiconductor memory and screening test method thereofTOSHIBA KK·Filed 1995·Granted Jul 2, 1996·23 cites·5 claims
- 1563US6922092B2Impedance controlled output driverRAMBUS INC·Filed 2003·Granted Jul 26, 2005·8 cites·50 claims
- 1663US5410512ASemiconductor memory deviceTOSHIBA KK·Filed 1993·Granted Apr 25, 1995·23 cites·10 claims
- 1761US8867868B2Semiconductor integrated circuitKUSHIYAMA NATSUKI·Filed 2007·Granted Oct 21, 2014·3 cites·14 claims
- 1856US9112516B2DLL circuit and semiconductor deviceTOSHIBA KK·Filed 2013·Granted Aug 18, 2015·1 cites·9 claims
- 1955US6594170B2Semiconductor integrated circuit device and semiconductor device systemTOSHIBA KK·Filed 2002·Granted Jul 15, 2003·11 cites·10 claims
- 2055US2015003779A1Semiconductor integrated circuitTOSHIBA KK·Filed 2014·Application pending·0 cites
- 2154US9263109B2Output driver to drive semiconductor device and memory systemTOSHIBA KK·Filed 2013·Granted Feb 16, 2016·1 cites·16 claims
- 2254US5933028AData transmitter circuit and semiconductor device using the sameTOSHIBA KK·Filed 1997·Granted Aug 3, 1999·12 cites·19 claims
- 2351US6563351B2Semiconductor integrated circuit having output bufferTOSHIBA KK·Filed 2001·Granted May 13, 2003·6 cites·22 claims
- 2448US4929945ASemiconductor memory device having a small number of signal linesTOSHIBA KK·Filed 1988·Granted May 29, 1990·10 cites·10 claims
- 2545USRE37184ESemiconductor memory and screening test method thereofTOSHIBA KK·Filed 1998·Granted May 22, 2001·7 cites·9 claims
- 2642US5396469ASRAM memory requiring reduced voltage swing during writeHEWLETT PACKARD CO·Filed 1994·Granted Mar 7, 1995·8 cites·5 claims
- 2740US2009127606A1Semiconductor integrated circuit deviceTOSHIBA KK·Filed 2008·Application pending·0 cites
- 2838US7113007B2Driver circuit and system including driver circuitTOSHIBA KK·Filed 2004·Granted Sep 26, 2006·2 cites·20 claims
- 2935US7657798B2Semiconductor integrated circuit and the same checking methodTOSHIBA KK·Filed 2006·Granted Feb 2, 2010·0 cites·18 claims
- 3035US2011227609A1Semiconductor integrated circuit capable of evaluating the characteristics of a transistorTOSHIBA KK·Filed 2011·Application pending·0 cites
- 3133US2002016932A1Semiconductor integrated circuit and semiconductor apparatus systemTOSHIBA KK·Filed 2001·Application pending·0 cites
- 3232US2015263731A1Level shift circuitTOSHIBA KK·Filed 2015·Application pending·0 cites
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