Inventor · disambiguated record
Namyeong Kwon
Also filed as: KWON NAMYEONG
2 granted patents·3 pending applications·2 citations·filing 2018–2025
34Inventor score
Files withSAMSUNG ELECTRONICS CO LTD5
Top patents by PatentIndex Score
5 records- 0170US10713778B2Semiconductor defect classification device, method for classifying defect of semiconductor, and semiconductor defect classification systemSAMSUNG ELECTRONICS CO LTD·Filed 2018·Granted Jul 14, 2020·2 cites·16 claims
- 0256US2025148174A1Method and device with in-fab wafer yield predictionSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0355US2024201638A1Method and device with process data analysisSAMSUNG ELECTRONICS CO LTD·Filed 2023·Application pending·0 cites
- 0441US2025226251A1Method and apparatus for determining contribution of factor during manufacturing of waferSAMSUNG ELECTRONICS CO LTD·Filed 2025·Application pending·0 cites
- 0532US11593657B2Machine learning device and machine learning method of machine learning deviceSAMSUNG ELECTRONICS CO LTD·Filed 2018·Granted Feb 28, 2023·0 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →