Inventor · disambiguated record
Naohiko Nishigaki
Also filed as: NISHIGAKI NAOHIKO
3 granted patents·13 citations·filing 1996–2008
61Inventor score
Top patents by PatentIndex Score
3 records- 0170US7836370B2Scan test circuit, semiconductor integrated circuit and scan enable signal time control circuitRICOH CO LTD·Filed 2008·Granted Nov 16, 2010·9 cites·5 claims
- 0239US8028255B2Semiconductor integrated circuit, semiconductor integrated circuit design support device, and semiconductor integrated circuit manufacturing methodRICOH CO LTD·Filed 2008·Granted Sep 27, 2011·0 cites·5 claims
- 0327US5706294AMethod of finding DC test point of an integrated circuitRICOH KK·Filed 1996·Granted Jan 6, 1998·4 cites·8 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →