Inventor · disambiguated record
Nathaniel Roisen
Also filed as: ROISEN NATHANIEL
2 granted patents·6 citations·filing 2019–2021
43Inventor score
Technology areasG01N
Files withCARL ZEISS IND METROLOGY LLC2
Top patents by PatentIndex Score
2 records- 0184US10598604B1Normal incidence phase-shifted deflectometry sensor, system, and method for inspecting a surface of a specimenCARL ZEISS IND METROLOGY LLC·Filed 2019·Granted Mar 24, 2020·6 cites·20 claims
- 0248US12175654B2Surface inspection system and method for differentiating particulate contamination from defects on a surface of a specimenCARL ZEISS IND METROLOGY LLC·Filed 2021·Granted Dec 24, 2024·0 cites·11 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →