Inventor · disambiguated record
Naoshi Sakaguchi
Also filed as: SAKAGUCHI NAOSHI
4 granted patents·4 pending applications·25 citations·filing 2008–2017
68Inventor score
Top patents by PatentIndex Score
8 records- 0190US10809208B2X-ray inspection device, X-ray inspection method, and method of manufacturing structureNIKON CORP·Filed 2017·Granted Oct 20, 2020·19 cites·22 claims
- 0274US7800748B2Edge inspection apparatusNIKON CORP·Filed 2008·Granted Sep 21, 2010·6 cites·15 claims
- 0351US2014002814A1Observation device and observation methodNIKON CORP·Filed 2013·Application pending·0 cites
- 0450US10571412B2X-ray apparatus and structure production methodNIKON CORP·Filed 2014·Granted Feb 25, 2020·0 cites·24 claims
- 0545US2011109738A1Observation device and observation methodNIKON CORP·Filed 2010·Application pending·0 cites
- 0643US2010053603A1Surface inspection apparatus and surface inspection methodNIKON CORP·Filed 2009·Application pending·0 cites
- 0741US10828694B2Casting device, method for detecting leakage of refrigerant in casting device, and leakage detection deviceSERINO DAISUKE·Filed 2016·Granted Nov 10, 2020·0 cites·9 claims
- 0838US2011064297A1Monitoring apparatus, monitoring method, inspecting apparatus and inspecting methodSAKAGUCHI NAOSHI·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →