Inventor · disambiguated record
Naoki Sakura
Also filed as: SAKURA NAOKI
10 granted patents·3 pending applications·55 citations·filing 1980–2020
86Inventor score
Top patents by PatentIndex Score
13 records- 0176US7851884B2Field-effect transistor, semiconductor chip and semiconductor deviceRENESAS ELECTRONICS CORP·Filed 2008·Granted Dec 14, 2010·10 cites·26 claims
- 0257US11145792B2Wavelength conversion layerSHOEI CHEMICAL IND CO·Filed 2019·Granted Oct 12, 2021·0 cites·20 claims
- 0356US11505742B2Semiconductor nanoparticles comprising ZnSTe shell layerSHOEI CHEMICAL IND CO·Filed 2019·Granted Nov 22, 2022·0 cites·10 claims
- 0454US4374828ABiologically active thymones from the thymusREAGENTS THE UNIVERSITY OF TEX·Filed 1980·Granted Feb 22, 1983·18 cites·4 claims
- 0552US12297521B2Method for producing particles and particle production apparatusSHOEI CHEMICAL IND CO·Filed 2020·Granted May 13, 2025·0 cites·29 claims
- 0652US8610237B2Semiconductor apparatusSAKURA NAOKI·Filed 2012·Granted Dec 17, 2013·1 cites·8 claims
- 0746US5763143AProcess of exactly patterning layer to target configuration by using photo-resist mask formed with dummy patternNEC CORP·Filed 1995·Granted Jun 9, 1998·11 cites·9 claims
- 0842US2009288852A1Electronic device and method of manufacturing the sameNEC ELECTRONICS CORP·Filed 2009·Application pending·0 cites
- 0940US5925902ASemiconductor device having a schottky film with a vertical gap formed thereinNEC CORP·Filed 1998·Granted Jul 20, 1999·6 cites·2 claims
- 1040US5869365AMethod of forming T electrode in field effect transistorNEC CORP·Filed 1997·Granted Feb 9, 1999·9 cites·20 claims
- 1136US2011215452A1Semiconductor package, substrate, electronic component, and method of mounting semiconductor packageRENESAS ELECTRONICS CORP·Filed 2011·Application pending·0 cites
- 1235US2019333706A1Can for Electrolytic CapacitorEPCOS AG·Filed 2017·Application pending·0 cites
- 1328US6372613B2Method of manufacturing a gate electrode with low resistance metal layer remote from a semiconductorNEC CORP·Filed 1999·Granted Apr 16, 2002·0 cites·3 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →