Inventor · disambiguated record
Nai-Yin Sung
Also filed as: SUNG NAI-YIN
3 granted patents·2 pending applications·83 citations·filing 2000–2004
74Inventor score
Top patents by PatentIndex Score
5 records- 0182US6424583B1System and measuring access time of embedded memoriesTAIWAN SEMICONDUCTOR MFG·Filed 2000·Granted Jul 23, 2002·38 cites·16 claims
- 0275US6941499B1Method to verify the performance of BIST circuitry for testing embedded memoryTAIWAN SEMICONDUCTOR MFG·Filed 2001·Granted Sep 6, 2005·28 cites·18 claims
- 0366US7103862B2Method to design and verify an integrated circuit device with multiple power domainsTAIWAN SEMICONDUCTOR MFG·Filed 2004·Granted Sep 5, 2006·17 cites·20 claims
- 0437US2005071144A1Method for providing VITAL model of embedded memory with delay back annotationTAIWAN SEMICONDUTOR MFG CO·Filed 2003·Application pending·0 cites
- 0534US2005071798A1Power supply layout for an integrated circuitGOYATEK TECHNOLOGY INC·Filed 2003·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →