Inventor · disambiguated record
Naomasa Suzuki
Also filed as: SUZUKI NAOMASA
54 granted patents·4 pending applications·692 citations·filing 1996–2025
98Inventor score
Files withHITACHI HIGH TECH CORP31HITACHI LTD11FUKUDA MUNEYUKI6MATSUSHITA ELECTRIC INDUSTRIAL CO LTD3FUKADA ATSUKO1
Top patents by PatentIndex Score
58 records- 0198US6847038B2Scanning electron microscopeHITACHI LTD·Filed 2003·Granted Jan 25, 2005·74 cites·12 claims
- 0295US7449690B2Inspection method and inspection apparatus using charged particle beamHITACHI HIGH TECH CORP·Filed 2006·Granted Nov 11, 2008·28 cites·20 claims
- 0395US6646262B1Scanning electron microscopeHITACHI LTD·Filed 2000·Granted Nov 11, 2003·57 cites·18 claims
- 0494US9659744B2Charged particle beam apparatus and inspection method using the sameHITACHI HIGH TECH CORP·Filed 2015·Granted May 23, 2017·7 cites·13 claims
- 0592US10879037B2Charged particle beam device with distance setting between irradiation regions in a scan lineHITACHI HIGH TECH CORP·Filed 2016·Granted Dec 29, 2020·8 cites·13 claims
- 0692US8841612B2Charged particle beam microscopeFUKUDA MUNEYUKI·Filed 2011·Granted Sep 23, 2014·12 cites·5 claims
- 0792US7462828B2Inspection method and inspection system using charged particle beamHITACHI HIGH TECH CORP·Filed 2006·Granted Dec 9, 2008·18 cites·30 claims
- 0892US6124699ABattery charger deviceMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1999·Granted Sep 26, 2000·197 cites·10 claims
- 0989US8153969B2Inspection method and inspection system using charged particle beamFUKADA ATSUKO·Filed 2008·Granted Apr 10, 2012·16 cites·7 claims
- 1088US7557347B2Charged particle beam apparatus, scanning electron microscope, and sample observation method using the sameHITACHI HIGH TECH CORP·Filed 2007·Granted Jul 7, 2009·11 cites·19 claims
- 1188US6765205B2Electron microscope including apparatus for X-ray analysis and method of analyzing specimens using sameHITACHI HIGH TECH CORP·Filed 2003·Granted Jul 20, 2004·37 cites·2 claims
- 1287US9704687B2Charged particle beam application deviceHITACHI HIGH TECH CORP·Filed 2015·Granted Jul 11, 2017·5 cites·9 claims
- 1387US8389935B2Charged particle beam apparatus permitting high-resolution and high-contrast observationFUKUDA MUNEYUKI·Filed 2009·Granted Mar 5, 2013·7 cites·12 claims
- 1486US10832886B2Beam irradiation deviceHITACHI HIGH TECH CORP·Filed 2019·Granted Nov 10, 2020·3 cites·11 claims
- 1586US7888640B2Scanning electron microscope and method of imaging an object by using the scanning electron microscopeHITACHI HIGH TECH CORP·Filed 2008·Granted Feb 15, 2011·9 cites·8 claims
- 1686US7875849B2Electron beam apparatus and electron beam inspection methodHITACHI HIGH TECH CORP·Filed 2007·Granted Jan 25, 2011·7 cites·12 claims
- 1786US7399966B2Scanning electron microscopeHITACHI LTD·Filed 2007·Granted Jul 15, 2008·6 cites·5 claims
- 1885US10269536B2Electron microscopeHITACHI HIGH TECH CORP·Filed 2015·Granted Apr 23, 2019·4 cites·14 claims
- 1985US8519334B2Scanning electron microscope and sample observation methodTAKADA SATOSHI·Filed 2011·Granted Aug 27, 2013·16 cites·11 claims
- 2085US6555819B1Scanning electron microscopeHITACHI LTD·Filed 2000·Granted Apr 29, 2003·19 cites·22 claims
- 2184US8431915B2Charged particle beam apparatus permitting high resolution and high-contrast observationFUKUDA MUNEYUKI·Filed 2012·Granted Apr 30, 2013·4 cites·13 claims
- 2284US5903004AEnergy dispersive X-ray analyzerHITACHI LTD·Filed 1997·Granted May 11, 1999·44 cites·11 claims
- 2382US8431893B2Electron beam apparatus and electron beam inspection methodFUKUDA MUNEYUKI·Filed 2012·Granted Apr 30, 2013·4 cites·2 claims
- 2482US7049591B2Scanning electron microscopeHITACHI LTD·Filed 2004·Granted May 23, 2006·11 cites·9 claims
- 2581US9287084B2Aberration corrector and charged particle beam apparatus using the sameHITACHI HIGH TECH CORP·Filed 2015·Granted Mar 15, 2016·3 cites·15 claims
- 2681US8207498B2Electron beam apparatus and electron beam inspection methodFUKUDA MUNEYUKI·Filed 2011·Granted Jun 26, 2012·4 cites·2 claims
- 2779US9653256B2Charged particle-beam deviceHITACHI HIGH TECH CORP·Filed 2014·Granted May 16, 2017·4 cites·12 claims
- 2879US9123501B2Device for correcting diffraction aberration of electron beamFUKUDA MUNEYUKI·Filed 2011·Granted Sep 1, 2015·4 cites·10 claims
- 2978US10121632B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2017·Granted Nov 6, 2018·2 cites·13 claims
- 3078US7294835B2Scanning electron microscopeHITACHI LTD·Filed 2006·Granted Nov 13, 2007·3 cites·10 claims
- 3177US8785890B2Charged particle beam apparatus permitting high-resolution and high-contrast observationHITACHI HIGH TECH CORP·Filed 2013·Granted Jul 22, 2014·2 cites·13 claims
- 3277US7619219B2Scanning electron microscopeHITACHI HIGH TECH CORP·Filed 2007·Granted Nov 17, 2009·4 cites·6 claims
- 3376US9324540B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2013·Granted Apr 26, 2016·3 cites·4 claims
- 3475US7504626B2Scanning electron microscope and apparatus for detecting defectHITACHI HIGH TECH CORP·Filed 2007·Granted Mar 17, 2009·3 cites·23 claims
- 3571US9159533B2Charged particle beam apparatus permitting high-resolution and high-contrast observationHITACHI HIGH TECH CORP·Filed 2014·Granted Oct 13, 2015·1 cites·15 claims
- 3669US11239042B2Beam irradiation deviceHITACHI HIGH TECH CORP·Filed 2020·Granted Feb 1, 2022·0 cites·5 claims
- 3768US9644955B2Scanning electron beam device with focus adjustment based on acceleration voltage and dimension measurement method using sameHITACHI HIGH TECH CORP·Filed 2012·Granted May 9, 2017·2 cites·12 claims
- 3868US8467595B2Defect review system and method, and programTAKAHASHI NORITSUGU·Filed 2009·Granted Jun 18, 2013·4 cites·5 claims
- 3968US5731580AScanning electron microscopeHITACHI LTD·Filed 1996·Granted Mar 24, 1998·19 cites·22 claims
- 4066US8222601B2Scanning electron microscope and method of imaging an object by using the scanning electron microscopeTACHIBANA ICHIRO·Filed 2011·Granted Jul 17, 2012·2 cites·8 claims
- 4165US10734191B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2015·Granted Aug 4, 2020·1 cites·13 claims
- 4264US9312099B2Charged particle beam device and method for analyzing defect thereinHITACHI HIGH TECH CORP·Filed 2013·Granted Apr 12, 2016·1 cites·11 claims
- 4364US8405026B2Charged particle beam apparatusSHOJO TOMOYASU·Filed 2009·Granted Mar 26, 2013·2 cites·3 claims
- 4463US10971328B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2020·Granted Apr 6, 2021·0 cites·15 claims
- 4563US6025593AScanning electron microscopeHITACHI LTD·Filed 1998·Granted Feb 15, 2000·16 cites·10 claims
- 4662US8629410B2Charged particle radiation deviceTSUJI HIROSHI·Filed 2010·Granted Jan 14, 2014·2 cites·6 claims
- 4761US11852599B2Image processing systemHITACHI HIGH TECH CORP·Filed 2021·Granted Dec 26, 2023·0 cites·15 claims
- 4859US2025175022A1ChargerPANASONIC AUTOMOTIVE SYSTEMS CO LTD·Filed 2025·Application pending·0 cites
- 4957US6979821B2Scanning electron microscopeHITACHI LTD·Filed 2003·Granted Dec 27, 2005·2 cites·4 claims
- 5054US7772553B2Scanning electron microscopeHITACHI HIGH TECH CORP·Filed 2007·Granted Aug 10, 2010·0 cites·10 claims
Showing the top 50 of 58 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →