Inventor · disambiguated record
Naohiro Takahashi
Also filed as: TAKAHASHI NAOHIRO
24 granted patents·9 pending applications·701 citations·filing 1985–2025
96Inventor score
Files withTS TECH CO LTD5CANON KK4FUJITSU LTD3DAINIPPON PRINTING CO LTD2FUJITSU MICROELECTRONICS LTD2
Top patents by PatentIndex Score
33 records- 0194US6386577B1Side-collision air bag deviceHONDA GIKEN KOGYOKABUSHIKI KAI·Filed 2000·Granted May 14, 2002·138 cites·4 claims
- 0294US6375269B1Seat having seating face made of sheet resilient materialTS TECH CO LTD·Filed 1998·Granted Apr 23, 2002·157 cites·9 claims
- 0393US8711122B2Sensor apparatus and information processing apparatusWADA YUTAKA·Filed 2011·Granted Apr 29, 2014·28 cites·8 claims
- 0491US6231125B1Seat with resilient sheet-formed seat cushionTS TECH CO LTD·Filed 1998·Granted May 15, 2001·97 cites·7 claims
- 0589US5951084ASeat structure for a vehicleHONDA MOTOR CO LTD·Filed 1997·Granted Sep 14, 1999·94 cites·6 claims
- 0685US6152534ASeat having seating face made of sheet resilient materialTS TECH CO LTD·Filed 1999·Granted Nov 28, 2000·81 cites·15 claims
- 0781US6378949B1Seat having seat surface portion made of surface-like elastic bodyTS TECH CO LTD·Filed 2000·Granted Apr 30, 2002·43 cites·4 claims
- 0879US7340352B2Inspecting method, inspecting apparatus, and method of manufacturing semiconductor deviceFUJITSU LTD·Filed 2006·Granted Mar 4, 2008·6 cites·18 claims
- 0978US2025145557A1Methods for producing arylamine compound and electrophotographic photosensitive memberCANON KK·Filed 2024·Application pending·0 cites
- 1075US8889244B2Transparent electrode device, information input device, and electronic equipmentMIZUNO MIKIHISA·Filed 2012·Granted Nov 18, 2014·4 cites·13 claims
- 1170US12215065B2Methods for producing arylamine compound and electrophotographic photosensitive memberCANON KK·Filed 2022·Granted Feb 4, 2025·0 cites·15 claims
- 1270US6422590B1Holder for mounting an air bag moduleTS TECH CO LTD·Filed 2001·Granted Jul 23, 2002·19 cites·12 claims
- 1369US2025258446A1Electrophotographic apparatus and process cartridgeCANON KK·Filed 2025·Application pending·0 cites
- 1468US12498645B2Electrophotographic photosensitive member, and electrophotographic apparatus and process cartridge each including the electrophotographic photosensitive memberCANON KK·Filed 2022·Granted Dec 16, 2025·0 cites·11 claims
- 1568US7755753B2Defect inspection apparatus, sensitivity calibration method for the same, substrate for defect detection sensitivity calibration, and manufacturing method thereofFUJITSU SEMICONDUCTOR LTD·Filed 2006·Granted Jul 13, 2010·3 cites·21 claims
- 1665US7064820B2Surface inspection method and surface inspection systemTOPCON CORP·Filed 2003·Granted Jun 20, 2006·6 cites·4 claims
- 1764US8339450B2Defect review apparatus and method for waferTAKAHASHI NAOHIRO·Filed 2009·Granted Dec 25, 2012·4 cites·18 claims
- 1864US7948618B2Defect inspection method and apparatus with a threshold value determinationFUJITSU SEMICONDUCTOR LTD·Filed 2006·Granted May 24, 2011·2 cites·3 claims
- 1963US7653236B2Surface inspection device and methodFUJITSU MICROELECTRONICS LTD·Filed 2005·Granted Jan 26, 2010·3 cites·8 claims
- 2057US2025151430A1Solid-state imaging deviceSONY SEMICONDUCTOR SOLUTIONS CORP·Filed 2022·Application pending·0 cites
- 2155US8270703B2Defect inspection apparatus, defect inspection method, and manufacture method for semiconductor deviceTAKAHASHI NAOHIRO·Filed 2009·Granted Sep 18, 2012·2 cites·12 claims
- 2253US12010791B2Device, electronic apparatus, and wiring connection methodSONY GROUP CORP·Filed 2020·Granted Jun 11, 2024·0 cites·12 claims
- 2351US7679737B2Method, system and apparatus of inspectionFUJITSU MICROELECTRONICS LTD·Filed 2008·Granted Mar 16, 2010·0 cites·18 claims
- 2451US2025048591A1Vapor chamber and electronic apparatusDAINIPPON PRINTING CO LTD·Filed 2022·Application pending·0 cites
- 2550US12457811B2Imaging device and electronic equipmentSONY SEMICONDUCTOR SOLUTIONS CORP·Filed 2022·Granted Oct 28, 2025·0 cites·20 claims
- 2650US2025185214A1Vapor chamber, electronic apparatus, and method for manufacturing vapor chamberDAINIPPON PRINTING CO LTD·Filed 2022·Application pending·0 cites
- 2749US4587226AProcess for producing antimony-containing oxide catalyst with improved strengthNITTO CHEMICAL INDUSTRY CO LTD·Filed 1985·Granted May 6, 1986·10 cites·5 claims
- 2842US2008073523A1Semiconductor wafer defect inspection method and apparatusFUJITSU LTD·Filed 2006·Application pending·0 cites
- 2940US2007035725A1Defect inspection apparatus, sensitivity calibration method for the same, substrate for defect detection sensitivity calibration, and manufacturing method thereofFUJITSU LTD·Filed 2005·Application pending·0 cites
- 3040US2011181545A1Sensor element and display apparatusSONY CORP·Filed 2011·Application pending·0 cites
- 3138US2003011564A1Portable information terminalFiled 2001·Application pending·0 cites
- 3235US8538131B2Defect inspection apparatus and method of defect inspectionYASUMOTO TAMIHIDE·Filed 2006·Granted Sep 17, 2013·0 cites·4 claims
- 3330US5690381ASpare seat for vehicleTOKYO SEAT KK·Filed 1995·Granted Nov 25, 1997·4 cites·44 claims
Join the waitlist — get patent alerts
Get an alert when Naohiro Takahashi files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →