Inventor · disambiguated record
Natsuki Tsuno
Also filed as: TSUNO NATSUKI
40 granted patents·7 pending applications·87 citations·filing 2005–2024
96Inventor score
Top patents by PatentIndex Score
47 records- 0198US11043359B2Charged particle beam apparatus and charged particle beam inspection systemHITACHI HIGH TECH CORP·Filed 2020·Granted Jun 22, 2021·14 cites·10 claims
- 0296US11398367B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2020·Granted Jul 26, 2022·4 cites·11 claims
- 0394US9659744B2Charged particle beam apparatus and inspection method using the sameHITACHI HIGH TECH CORP·Filed 2015·Granted May 23, 2017·7 cites·13 claims
- 0492US10879037B2Charged particle beam device with distance setting between irradiation regions in a scan lineHITACHI HIGH TECH CORP·Filed 2016·Granted Dec 29, 2020·8 cites·13 claims
- 0591US11011348B2Scanning electron microscope and sample observation method using scanning electron microscopeHITACHI HIGH TECH CORP·Filed 2017·Granted May 18, 2021·8 cites·12 claims
- 0690US11398366B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2020·Granted Jul 26, 2022·2 cites·14 claims
- 0790US10971347B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2016·Granted Apr 6, 2021·9 cites·7 claims
- 0889US11355308B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2020·Granted Jun 7, 2022·2 cites·13 claims
- 0988US11749494B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2021·Granted Sep 5, 2023·1 cites·16 claims
- 1088US9236220B2Electronic microscope, setting method of observation condition of electronic microscope, and observation method using electronic microscopeHITACHI HIGH TECH CORP·Filed 2013·Granted Jan 12, 2016·8 cites·17 claims
- 1182US8907279B2Electron microscope and image capturing method using electron beamTSUNO NATSUKI·Filed 2012·Granted Dec 9, 2014·8 cites·19 claims
- 1280US11328897B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2020·Granted May 10, 2022·1 cites·17 claims
- 1378US11393657B2Electron beam deviceHITACHI HIGH TECH CORP·Filed 2018·Granted Jul 19, 2022·2 cites·15 claims
- 1478US10121632B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2017·Granted Nov 6, 2018·2 cites·13 claims
- 1574US12450715B2System for deriving electrical characteristics and non-transitory computer-readable mediumHITACHI HIGH TECH CORP·Filed 2023·Granted Oct 21, 2025·0 cites·12 claims
- 1674US2024363306A1Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2024·Application pending·0 cites
- 1773US12394041B2System for deriving electrical characteristics and non-transitory computer-readable mediumHITACHI HIGH TECH CORP·Filed 2023·Granted Aug 19, 2025·0 cites·14 claims
- 1873US9508611B2Semiconductor inspection method, semiconductor inspection device and manufacturing method of semiconductor elementHITACHI LTD·Filed 2013·Granted Nov 29, 2016·3 cites·15 claims
- 1971US11646172B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2021·Granted May 9, 2023·0 cites·14 claims
- 2070US11631568B2Device defect detection method using a charged particle beamHITACHI HIGH TECH CORP·Filed 2021·Granted Apr 18, 2023·0 cites·16 claims
- 2170US10121634B2Charged particle beam device and charged particle beam measurement methodHITACHI HIGH TECH CORP·Filed 2014·Granted Nov 6, 2018·2 cites·14 claims
- 2270US7910884B2Apparatus and method for inspection and measurementHITACHI HIGH TECH CORP·Filed 2009·Granted Mar 22, 2011·2 cites·15 claims
- 2368US11043358B2Measuring apparatus and method of setting observation conditionHITACHI HIGH TECH CORP·Filed 2017·Granted Jun 22, 2021·1 cites·17 claims
- 2464US11694325B2System for deriving electrical characteristics and non-transitory computer-readable mediumHITACHI HIGH TECH CORP·Filed 2020·Granted Jul 4, 2023·0 cites·19 claims
- 2562US11776103B2System for deriving electrical characteristics and non-transitory computer-readable mediumHITACHI HIGH TECH CORP·Filed 2020·Granted Oct 3, 2023·0 cites·18 claims
- 2660US8586920B2Charged particle beam apparatusTSUNO NATSUKI·Filed 2009·Granted Nov 19, 2013·1 cites·19 claims
- 2755US12001521B2Adjusting method of charged particle beam device and charged particle beam device systemHITACHI HIGH TECH CORP·Filed 2019·Granted Jun 4, 2024·0 cites·20 claims
- 2855US7633303B2Semiconductor wafer inspection apparatusHITACHI HIGH TECH CORP·Filed 2008·Granted Dec 15, 2009·2 cites·5 claims
- 2954US11335535B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2020·Granted May 17, 2022·0 cites·3 claims
- 3054US2022216032A1Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2019·Application pending·0 cites
- 3153US12196802B2Semiconductor inspection device and method for inspecting semiconductor sampleHITACHI HIGH TECH CORP·Filed 2020·Granted Jan 14, 2025·0 cites·19 claims
- 3249US11869745B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2019·Granted Jan 9, 2024·0 cites·7 claims
- 3349US2024177964A1Charged Particle Beam SystemHITACHI HIGH TECH CORP·Filed 2021·Application pending·0 cites
- 3449US2024151665A1Inspection systemHITACHI HIGH TECH CORP·Filed 2021·Application pending·0 cites
- 3548US12406826B2Charged particle beam device and sample observation methodHITACHI HIGH TECH CORP·Filed 2020·Granted Sep 2, 2025·0 cites·15 claims
- 3648US9202668B2Observation specimen for use in electron microscopy, electron microscopy, electron microscope, and device for producing observation specimenHITACHI HIGH TECH CORP·Filed 2012·Granted Dec 1, 2015·0 cites·17 claims
- 3747US10256068B2Charged particle beam apparatusHITACHI LTD·Filed 2017·Granted Apr 9, 2019·0 cites·14 claims
- 3846US12437962B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2020·Granted Oct 7, 2025·0 cites·13 claims
- 3945US2005236380A1Ultrashort pulse laser processing methodOLYMPUS CORP·Filed 2005·Application pending·0 cites
- 4044US12181513B2Inspection methodHITACHI HIGH TECH CORP·Filed 2020·Granted Dec 31, 2024·0 cites·12 claims
- 4143US11610754B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2018·Granted Mar 21, 2023·0 cites·15 claims
- 4242US11232929B2Method for determining irradiation conditions for charged particle beam device and charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2018·Granted Jan 25, 2022·0 cites·18 claims
- 4341US10453648B2Charged particle bean device and information-processing deviceHITACHI HIGH TECH CORP·Filed 2015·Granted Oct 22, 2019·0 cites·15 claims
- 4440US9846133B2Semiconductor inspection device including a counter electrode with adjustable potentials used to obtain images for detection of defects, and inspection method using charged particle beamHITACHI LTD·Filed 2012·Granted Dec 19, 2017·0 cites·4 claims
- 4537US11183362B2Charged particle beam apparatus and sample observation method using the sameHITACHI HIGH TECH CORP·Filed 2017·Granted Nov 23, 2021·0 cites·11 claims
- 4637US2012292506A1Sample observation method using electron beams and electron microscopeTSUNO NATSUKI·Filed 2010·Application pending·0 cites
- 4733US2021233740A1Charged Particle Microscope and Method of Imaging SampleHITACHI HIGH TECH CORP·Filed 2016·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →