Inventor · disambiguated record
Naoki Yasuda
Also filed as: YASUDA NAOKI
109 granted patents·23 pending applications·1,212 citations·filing 1995–2025
99Inventor score
Top patents by PatentIndex Score
132 records- 0197US7956406B2Nonvolatile semiconductor memory deviceTOSHIBA KK·Filed 2008·Granted Jun 7, 2011·36 cites·10 claims
- 0297US7560767B2Nonvolatile semiconductor memory deviceTOSHIBA KK·Filed 2006·Granted Jul 14, 2009·64 cites·20 claims
- 0397US6319853B1Method of manufacturing a semiconductor device using a minute resist pattern, and a semiconductor device manufactured therebyMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Nov 20, 2001·136 cites·20 claims
- 0495US7989871B2Nonvolatile semiconductor memory device having insulating films that include multiple layers formed by insulating materials having d-orbital metal element and insulating materials without d-orbital metal elementTOSHIBA KK·Filed 2007·Granted Aug 2, 2011·43 cites·8 claims
- 0595US6320220B1Quantum tunneling effect device and semiconductor composite substrateTOSHIBA KK·Filed 2000·Granted Nov 20, 2001·97 cites·15 claims
- 0692US9893075B1Semiconductor memory deviceTOSHIBA MEMORY CORP·Filed 2017·Granted Feb 13, 2018·7 cites·13 claims
- 0792US6111288AQuantum tunneling effect device and semiconductor composite substrateTOSHIBA KK·Filed 1998·Granted Aug 29, 2000·88 cites·12 claims
- 0891US8674430B2Nonvolatile semiconductor storage deviceYASUDA NAOKI·Filed 2012·Granted Mar 18, 2014·9 cites·9 claims
- 0991US8030701B2Memory cell of nonvolatile semiconductor memory deviceTOSHIBA KK·Filed 2009·Granted Oct 4, 2011·20 cites·20 claims
- 1091US7781824B2Memory cell of nonvolatile semiconductor memoryTOSHIBA KK·Filed 2008·Granted Aug 24, 2010·22 cites·12 claims
- 1190US8766446B2Semiconductor memory deviceKUGE NOBUHITO·Filed 2012·Granted Jul 1, 2014·23 cites·10 claims
- 1290US8237217B2Nonvolatile semiconductor memory deviceYASUDA NAOKI·Filed 2011·Granted Aug 7, 2012·6 cites·20 claims
- 1389US9224875B2Nonvolatile semiconductor storage deviceTOSHIBA KK·Filed 2015·Granted Dec 29, 2015·4 cites·10 claims
- 1489US8013380B2Non-volatile semiconductor memory device and method of manufacturing the sameTOSHIBA KK·Filed 2008·Granted Sep 6, 2011·12 cites·4 claims
- 1588US8823080B2Nonvolatile semiconductor memory deviceTOSHIBA KK·Filed 2013·Granted Sep 2, 2014·4 cites·29 claims
- 1688US8324657B2Semiconductor deviceSHIMIZU KAZUHIRO·Filed 2011·Granted Dec 4, 2012·6 cites·2 claims
- 1788US7989876B2Nonvolatile semiconductor memory deviceTOSHIBA KK·Filed 2007·Granted Aug 2, 2011·16 cites·18 claims
- 1887US9496278B2Nonvolatile semiconductor storage deviceTOSHIBA KK·Filed 2015·Granted Nov 15, 2016·3 cites·21 claims
- 1986US7481885B2Semiconductor device manufacturing apparatus, semiconductor device manufacturing method and semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 2006·Granted Jan 27, 2009·8 cites·4 claims
- 2085US9123749B2Nonvolatile semiconductor memory device and method of manufacturing the sameTOSHIBA KK·Filed 2013·Granted Sep 1, 2015·8 cites·11 claims
- 2185US5851842AMeasurement system and measurement methodTOSHIBA KK·Filed 1997·Granted Dec 22, 1998·86 cites·22 claims
- 2284US9991274B2Semiconductor memory device and method for manufacturing the sameTOSHIBA MEMORY CORP·Filed 2016·Granted Jun 5, 2018·2 cites·16 claims
- 2384US8426909B2Nonvolatile semiconductor memory deviceYASUDA NAOKI·Filed 2012·Granted Apr 23, 2013·3 cites·20 claims
- 2484US8415736B2Non-volatile semiconductor memory device and method of manufacturing the sameNAKASAKI YASUSHI·Filed 2012·Granted Apr 9, 2013·6 cites·16 claims
- 2584US6924240B2Low dielectric constant material, insulating film comprising the low dielectric constant material, and semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 2002·Granted Aug 2, 2005·24 cites·18 claims
- 2684US6732583B1Sensor element and its manufacturing methodMITSUBISHI ELECTRIC CORP·Filed 2000·Granted May 11, 2004·28 cites·12 claims
- 2783US9917095B2Nonvolatile semiconductor storage deviceTOSHIBA MEMORY CORP·Filed 2016·Granted Mar 13, 2018·2 cites·11 claims
- 2883US8569823B2Semiconductor device and manufacturing method thereofINO TSUNEHIRO·Filed 2011·Granted Oct 29, 2013·7 cites·17 claims
- 2983US6180320B1Method of manufacturing a semiconductor device having a fine pattern, and semiconductor device manufactured therebyMITSUBISHI ELECTRIC CORP·Filed 1999·Granted Jan 30, 2001·70 cites·17 claims
- 3082US9425207B2Memory device with different memory film diameters in the same laminate levelTOSHIBA KK·Filed 2014·Granted Aug 23, 2016·7 cites·15 claims
- 3182US8546868B2Non-volatile semiconductor memory device and method of manufacturing the sameTOSHIBA KK·Filed 2013·Granted Oct 1, 2013·4 cites·18 claims
- 3282US8461563B2Resistance change memoryYASUDA NAOKI·Filed 2011·Granted Jun 11, 2013·8 cites·20 claims
- 3381US8698313B2Nonvolatile semiconductor memory apparatusHIRANO IZUMI·Filed 2012·Granted Apr 15, 2014·8 cites·12 claims
- 3480US8294195B2Nonvolatile semiconductor memory element, nonvolatile semiconductor memory, and method for operating nonvolatile semiconductor memory elementSHINGU MASAO·Filed 2011·Granted Oct 23, 2012·3 cites·20 claims
- 3580US6891368B2Magnetoresistive sensor deviceMITSUBISHI ELECTRIC CORP·Filed 2002·Granted May 10, 2005·25 cites·10 claims
- 3679US11917827B2Semiconductor memory device and method for manufacturing the sameKIOXIA CORP·Filed 2022·Granted Feb 27, 2024·0 cites·14 claims
- 3779US8391075B2Nonvolatile semiconductor memory device and method for driving sameFUJIKI JUN·Filed 2011·Granted Mar 5, 2013·6 cites·9 claims
- 3878US6703132B1Magnetoresistance sensor element and method of fabricating the magnetoresistance elementMITSUBISHI ELECTRIC CORP·Filed 1999·Granted Mar 9, 2004·38 cites·10 claims
- 3978US6399733B1Process for preparing a highly pure silicone ladder polymerMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Jun 4, 2002·14 cites·10 claims
- 4078US6060403AMethod of manufacturing semiconductor deviceTOSHIBA KK·Filed 1998·Granted May 9, 2000·49 cites·20 claims
- 4178US5586006AMulti-chip module having a multi-layer circuit board with insulating layers and wiring conductors stacked togetherFUJITSU LTD·Filed 1995·Granted Dec 17, 1996·59 cites·32 claims
- 4277US8154072B2Nonvolatile semiconductor memory apparatusKOIKE MASAHIRO·Filed 2009·Granted Apr 10, 2012·7 cites·10 claims
- 4376US9379256B2Nonvolatile semiconductor memory deviceTOSHIBA KK·Filed 2015·Granted Jun 28, 2016·1 cites·41 claims
- 4476US8609443B2Semiconductor device manufacturing methodSHIMIZU KAZUHIRO·Filed 2012·Granted Dec 17, 2013·2 cites·7 claims
- 4576US6656982B2Woody thermoplastic resin compositionAJINOMOTO KK·Filed 2001·Granted Dec 2, 2003·17 cites·26 claims
- 4675US8058681B2Nonvolatile semiconductor memory element, nonvolatile semiconductor memory, and method for operating nonvolatile semiconductor memory elementSHINGU MASAO·Filed 2009·Granted Nov 15, 2011·3 cites·18 claims
- 4773US9196629B2Non-volatile semiconductor memory device having carbon doped columnar semiconductor layerTOSHIBA KK·Filed 2014·Granted Nov 24, 2015·3 cites·13 claims
- 4873US6903149B2Composition for wood-polymer composite and wood-polymer composite made from the compositionAJINOMOTO KK·Filed 2002·Granted Jun 7, 2005·12 cites·19 claims
- 4973US6500889B2Flame-retarded thermoplastic resin compositionAJINOMOTO KK·Filed 2001·Granted Dec 31, 2002·14 cites·14 claims
- 5072US11264398B2Semiconductor memory device and method for manufacturing the sameKIOXIA CORP·Filed 2020·Granted Mar 1, 2022·0 cites·8 claims
Showing the top 50 of 132 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →