Inventor · disambiguated record
Naoko Yoshida
Also filed as: YOSHIDA NAOKO
17 granted patents·8 pending applications·100 citations·filing 1989–2022
91Inventor score
Files withFUJIFILM CORP15EASTMAN KODAK CO3NITTO DENKO CORP2IGARASHI KAZUMASA1MATSUSHITA ELECTRIC INDUSTRIAL CO LTD1
Top patents by PatentIndex Score
25 records- 0190US9750326B2Transparency evaluation device, transparency evaluation method and transparency evaluation programFUJIFILM CORP·Filed 2015·Granted Sep 5, 2017·6 cites·11 claims
- 0282US9787965B2Camera system, color conversion device and method employed thereupon, and recording medium for color conversion programFUJIFILM CORP·Filed 2015·Granted Oct 10, 2017·8 cites·29 claims
- 0382US9351683B2Wrinkle detection method, wrinkle detection device and recording medium storing wrinkle detection program, as well as wrinkle evaluation method, wrinkle evaluation device and recording medium storing wrinkle evaluation programFUJIFILM CORP·Filed 2014·Granted May 31, 2016·6 cites·18 claims
- 0469US10743769B2Skin evaluation apparatus, skin evaluation method, and skin evaluation programFUJIFILM CORP·Filed 2017·Granted Aug 18, 2020·1 cites·8 claims
- 0569US10638968B2Skin gloss evaluation device, skin gloss evaluation method, and skin gloss evaluation programFUJIFILM CORP·Filed 2018·Granted May 5, 2020·1 cites·12 claims
- 0667US10964062B2Skin evaluation device, skin evaluation method, and skin evaluation programFUJIFILM CORP·Filed 2018·Granted Mar 30, 2021·1 cites·8 claims
- 0766US12283033B2Damage diagram creation support method and damage diagram creation support deviceFUJIFILM CORP·Filed 2022·Granted Apr 22, 2025·0 cites·10 claims
- 0865US8124457B2Manufacturing method of transferring a wiring circuit layer on a metal support substrate to a semiconductor elementODA TAKASHI·Filed 2009·Granted Feb 28, 2012·2 cites·12 claims
- 0961US2023111766A1Structure inspection method and structure inspection systemFUJIFILM CORP·Filed 2022·Application pending·0 cites
- 1060US8183093B2Method of manufacturing a semiconductor device by laminationYOSHIDA NAOKO·Filed 2010·Granted May 22, 2012·2 cites·8 claims
- 1160US5065440APattern recognition apparatusEASTMAN KODAK CO·Filed 1990·Granted Nov 12, 1991·40 cites·3 claims
- 1258US10383567B2Skin evaluation method and skin evaluation deviceFUJIFILM CORP·Filed 2014·Granted Aug 20, 2019·1 cites·2 claims
- 1357US12235191B2Flight imaging system and methodFUJIFILM CORP·Filed 2022·Granted Feb 25, 2025·0 cites·10 claims
- 1457US9450158B2Epoxy resin composition for optical semiconductor device, and lead frame for optical semiconductor device, encapsulation type optical semiconductor element unit and optical semiconductor device each obtainable by using the epoxy resin compositionNITTO DENKO CORP·Filed 2014·Granted Sep 20, 2016·0 cites·19 claims
- 1557US4933686AMethod of and apparatus for transferring an image in a thermal transfer printerEASTMAN KODAK CO·Filed 1989·Granted Jun 12, 1990·16 cites·1 claims
- 1654US2023082753A1Structure inspection method and structure inspection systemFUJIFILM CORP·Filed 2022·Application pending·0 cites
- 1750US2009280239A1Method of manufacturing printed circuit boardNITTO DENKO CORP·Filed 2009·Application pending·0 cites
- 1848US2012260980A1Dye-sensitized solar cell, and seal member to be used for the dye-sensitized solar cellIGARASHI KAZUMASA·Filed 2012·Application pending·0 cites
- 1943US2014315046A1Microbial power generation device, electrode for microbial power generation device, and method for producing sameNAT UNIV CORP TOYOHASHI UNIV·Filed 2012·Application pending·0 cites
- 2042US2018116582A1Elasticity evaluation apparatus, elasticity evaluation method, and elasticity evaluation programFUJIFILM CORP·Filed 2017·Application pending·0 cites
- 2140US5121444APattern recognition apparatusEASTMAN KODAK CO·Filed 1990·Granted Jun 9, 1992·14 cites·2 claims
- 2238US10188352B2Acne-affected skin determination method and acne-affected skin determination deviceFUJIFILM CORP·Filed 2015·Granted Jan 29, 2019·0 cites·9 claims
- 2336US2016345887A1Moisture feeling evaluation device, moisture feeling evaluation method, and moisture feeling evaluation programFUJIFILM CORP·Filed 2016·Application pending·0 cites
- 2433US2017079599A1Moisture feeling evaluation device, moisture feeling evaluation method, and moisture feeling evaluation programFUJIFILM CORP·Filed 2016·Application pending·0 cites
- 2529US5776358AElectrolyte for driving electrolytic capacitor and electrolytic capacitor using the sameMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1996·Granted Jul 7, 1998·2 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →