Inventor · disambiguated record
Naoki Yutani
Also filed as: YUTANI NAOKI
21 granted patents·1 pending application·118 citations·filing 1988–2017
94Inventor score
Files withMITSUBISHI ELECTRIC CORP13WATANABE HIROSHI2CHIKAMORI DAISUKE1MATSUNO YOSHINORI1MIURA NARUHISA1
Top patents by PatentIndex Score
22 records- 0187US6393919B1Pressure sensor with a thermal pressure detecting elementMITSUBISHI ELECTRIC CORP·Filed 2000·Granted May 28, 2002·35 cites·17 claims
- 0276US9105715B2Semiconductor device and method for manufacturing the sameMIURA NARUHISA·Filed 2009·Granted Aug 11, 2015·6 cites·10 claims
- 0372US9184307B2Silicon carbide semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 2014·Granted Nov 10, 2015·3 cites·15 claims
- 0470US8304901B2Semiconductor device having a groove and a junction termination extension layer surrounding a guard ring layerWATANABE HIROSHI·Filed 2009·Granted Nov 6, 2012·4 cites·9 claims
- 0567US9059193B2Epitaxial wafer and semiconductor elementOHTSUKA KENICHI·Filed 2010·Granted Jun 16, 2015·2 cites·4 claims
- 0665US8963276B2Semiconductor device including a cell array having first cells and second cells interspersed around the arrangement of the first cellsWATANABE HIROSHI·Filed 2011·Granted Feb 24, 2015·2 cites·7 claims
- 0765US8587072B2Silicon carbide semiconductor deviceORITSUKI YASUNORI·Filed 2012·Granted Nov 19, 2013·3 cites·7 claims
- 0865US8178972B2Semiconductor device and manufacturing method thereforYUTANI NAOKI·Filed 2010·Granted May 15, 2012·4 cites·15 claims
- 0958US6619130B1Pressure sensorMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Sep 16, 2003·9 cites·3 claims
- 1058US5444484ASolid-state imaging deviceMITSUBISHI ELECTRIC CORP·Filed 1992·Granted Aug 22, 1995·18 cites·4 claims
- 1156US5040038ASolid-state image sensorMITSUBISHI ELECTRIC CORP·Filed 1988·Granted Aug 13, 1991·15 cites·21 claims
- 1253US6591683B1Pressure sensorMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Jul 15, 2003·7 cites·3 claims
- 1350US7880763B2Semiconductor device and manufacturing method thereforMITSUBISHI ELECTRIC CORP·Filed 2008·Granted Feb 1, 2011·2 cites·8 claims
- 1447US9502553B2Semiconductor device and method for manufacturing the sameMITSUBISHI ELECTRIC CORP·Filed 2015·Granted Nov 22, 2016·0 cites·19 claims
- 1546US10276711B2Semiconductor device and method of manufacturing the sameMITSUBISHI ELECTRIC CORP·Filed 2017·Granted Apr 30, 2019·0 cites·10 claims
- 1643US9362391B2Silicon carbide semiconductor device and method of manufacturing the sameTARUI YOICHIRO·Filed 2011·Granted Jun 7, 2016·0 cites·16 claims
- 1742US8569123B2Method for manufacturing silicon carbide semiconductor deviceMATSUNO YOSHINORI·Filed 2009·Granted Oct 29, 2013·0 cites·8 claims
- 1842US8377811B2Method for manufacturing silicon carbide semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 2008·Granted Feb 19, 2013·0 cites·15 claims
- 1935US6207067B1Method for fabricating oxide superconducting deviceMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Mar 27, 2001·4 cites·5 claims
- 2035US5060038ACharge sweep solid-state image sensorMITSUBISHI ELECTRIC CORP·Filed 1989·Granted Oct 22, 1991·4 cites·27 claims
- 2135US2006131745A1Semiconductor device and manufacturing method thereforMITSUBISHI ELECTRIC CORP·Filed 2005·Application pending·0 cites
- 2227US9685566B2Method of manufacturing silicon carbide semiconductor deviceCHIKAMORI DAISUKE·Filed 2012·Granted Jun 20, 2017·0 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →