Inventor · disambiguated record
Neil J. Goldfine
Also filed as: GOLDFINE NEIL · GOLDFINE NEIL J
89 granted patents·23 pending applications·2,011 citations·filing 1986–2025
99Inventor score
Files withJENTEK SENSORS INC89GOLDFINE NEIL J13MASSACHUSETTS INST TECHNOLOGY6SHEIRETOV YANKO K2SCHLICKER DARRELL E1
Top patents by PatentIndex Score
112 records- 0198US5453689AMagnetometer having periodic winding structure and material property estimatorMASSACHUSETTS INST TECHNOLOGY·Filed 1991·Granted Sep 26, 1995·147 cites·61 claims
- 0297US6784662B2Eddy current sensor arrays having drive windings with extended portionsJENTEK SENSORS INC·Filed 2002·Granted Aug 31, 2004·94 cites·49 claims
- 0397US6657429B1Material condition assessment with spatially periodic field sensorsJENTEK SENSORS INC·Filed 2000·Granted Dec 2, 2003·116 cites·26 claims
- 0495US7528598B2Fastener and fitting based sensing methodsJENTEK SENSORS INC·Filed 2006·Granted May 5, 2009·27 cites·33 claims
- 0595US6995557B2High resolution inductive sensor arrays for material and defect characterization of weldsJENTEK SENSORS INC·Filed 2004·Granted Feb 7, 2006·64 cites·25 claims
- 0695US6952095B1Surface mounted and scanning spatially periodic eddy-current sensor arraysJENTEK SENSORS INC·Filed 2000·Granted Oct 4, 2005·61 cites·58 claims
- 0795US6727691B2High resolution inductive sensor arrays for material and defect characterization of weldsJENTEK SENSORS INC·Filed 2002·Granted Apr 27, 2004·67 cites·44 claims
- 0894US7451657B2Material condition monitoring with multiple sensing modesJENTEK SENSORS INC·Filed 2005·Granted Nov 18, 2008·29 cites·21 claims
- 0994US7230421B2Damage standard fabrication with attached sensorJENTEK SENSORS INC·Filed 2005·Granted Jun 12, 2007·26 cites·17 claims
- 1094US6992482B2Magnetic field sensor having a switchable drive current spatial distributionJENTEK SENSORS INC·Filed 2001·Granted Jan 31, 2006·44 cites·20 claims
- 1194US6380747B1Methods for processing, optimization, calibration and display of measured dielectrometry signals using property estimation gridsJENTEK SENSORS INC·Filed 1999·Granted Apr 30, 2002·94 cites·8 claims
- 1294US5793206AMeandering winding test circuitJENTEK SENSORS INC·Filed 1996·Granted Aug 11, 1998·136 cites·12 claims
- 1393US8237433B2Magnetic field characterization of stresses and properties in materialsGOLDFINE NEIL J·Filed 2011·Granted Aug 7, 2012·9 cites·35 claims
- 1493US7467057B2Material property estimation using non-orthogonal responsive databasesJENTEK SENSORS INC·Filed 2005·Granted Dec 16, 2008·16 cites·14 claims
- 1592US7348771B2Method for verifying sensor conditionJENTEK SENSORS INC·Filed 2006·Granted Mar 25, 2008·16 cites·20 claims
- 1692US6351120B2Test circuit on flexible membrane with adhesiveJENTEK SENSORS INC·Filed 2000·Granted Feb 26, 2002·35 cites·6 claims
- 1791US12253492B2In-process quality assessment for additive manufacturingJENTEK SENSORS INC·Filed 2023·Granted Mar 18, 2025·0 cites·11 claims
- 1891US9255875B2Method and apparatus for inspection of corrosion and other defects through insulationJENTEK SENSORS INC·Filed 2012·Granted Feb 9, 2016·12 cites·20 claims
- 1991US7994781B2Eddy current sensor with concentric segmentsJENTEK SENSORS INC·Filed 2009·Granted Aug 9, 2011·14 cites·28 claims
- 2091US6188218B1Absolute property measurement with air calibrationJENTEK SENSORS INC·Filed 1998·Granted Feb 13, 2001·87 cites·44 claims
- 2190US10444189B2Method and apparatus for non-destructive evaluation of materialsJENTEK SENSORS INC·Filed 2017·Granted Oct 15, 2019·3 cites·6 claims
- 2290US7589526B2Surface mounted sensor arrays having segmented primary windingsJENTEK SENSORS INC·Filed 2007·Granted Sep 15, 2009·12 cites·17 claims
- 2390US5629621AApparatus and methods for obtaining increased sensitivity, selectivity and dynamic range in property measurement using magnetometersMASSACHUSETTS INST TECHNOLOGY·Filed 1995·Granted May 13, 1997·71 cites·6 claims
- 2489US8960012B2Method and apparatus for detection and characterization of mechanical damageJENTEK SENSORS INC·Filed 2013·Granted Feb 24, 2015·13 cites·20 claims
- 2589US7876094B2Magnetic field characterization of stresses and properties in materialsJENTEK SENSORS INC·Filed 2008·Granted Jan 25, 2011·9 cites·18 claims
- 2689US7049811B2Test circuit having parallel drive segments and a plurality of sense elementsJENTEK SENSORS INC·Filed 2004·Granted May 23, 2006·28 cites·28 claims
- 2788US7451639B2Engine blade dovetail inspectionJENTEK SENSORS INC·Filed 2007·Granted Nov 18, 2008·18 cites·23 claims
- 2888US7385392B2Eddy current sensing arrays and systemJENTEK SENSORS INC·Filed 2002·Granted Jun 10, 2008·33 cites·32 claims
- 2988US5966011AApparatus for measuring bulk materials and surface conditions for flat and curved partsJENTEK SENSORS INC·Filed 1998·Granted Oct 12, 1999·60 cites·12 claims
- 3087US7696748B2Absolute property measurements using electromagnetic sensorsJENTEK SENSORS INC·Filed 2004·Granted Apr 13, 2010·31 cites·18 claims
- 3187US7289913B2Local feature characterization using quasistatic electromagnetic sensorsJENTEK SENSORS INC·Filed 2005·Granted Oct 30, 2007·11 cites·14 claims
- 3287US6377039B1Method for characterizing coating and substratesJENTEK SENSORS INC·Filed 1998·Granted Apr 23, 2002·72 cites·43 claims
- 3386US8494810B2Component adaptive life managementGOLDFINE NEIL J·Filed 2010·Granted Jul 23, 2013·20 cites·23 claims
- 3486US8050883B2Material property estimation using inverse interpolationJENTEK SENSORS INC·Filed 2008·Granted Nov 1, 2011·9 cites·15 claims
- 3586US7518360B2Hybrid wound/etched winding constructs for scanning and monitoringJENTEK SENSORS INC·Filed 2007·Granted Apr 14, 2009·11 cites·30 claims
- 3685US11747304B2In-process quality assessment for additive manufacturingJENTEK SENSORS INC·Filed 2023·Granted Sep 5, 2023·0 cites·5 claims
- 3785US7280940B2Segmented field dielectric sensor array for material characterizationJENTEK SENSORS INC·Filed 2006·Granted Oct 9, 2007·9 cites·28 claims
- 3885US6486673B1Segmented field dielectrometerJENTEK SENSORS INC·Filed 2000·Granted Nov 26, 2002·57 cites·19 claims
- 3984US7188532B2Self-monitoring metals, alloys and materialsJENTEK SENSORS INC·Filed 2004·Granted Mar 13, 2007·20 cites·13 claims
- 4083US10324062B2Method and apparatus for measurement of material conditionJENTEK SENSORS INC·Filed 2014·Granted Jun 18, 2019·4 cites·4 claims
- 4183US7106055B2Fabrication of samples having predetermined material conditionsJENTEK SENSORS INC·Filed 2004·Granted Sep 12, 2006·20 cites·40 claims
- 4283US2025224374A1In-Process Quality Assessment for Additive ManufacturingJENTEK SENSORS INC·Filed 2025·Application pending·0 cites
- 4382US11543388B2In-process quality assessment for additive manufacturingJENTEK SENSORS INC·Filed 2022·Granted Jan 3, 2023·0 cites·20 claims
- 4482US10732096B2Method and apparatus for inspection of corrosion and other defects through insulationJENTEK SENSORS INC·Filed 2017·Granted Aug 4, 2020·2 cites·20 claims
- 4582US7183764B2Method for inspecting a channel using a flexible sensorJENTEK SENSORS INC·Filed 2003·Granted Feb 27, 2007·20 cites·14 claims
- 4681US8928316B2Method and apparatus for non-destructive evaluation of materialsGOLDFINE NEIL J·Filed 2011·Granted Jan 6, 2015·3 cites·8 claims
- 4781US7161350B2Method for material property monitoring with perforated, surface mounted sensorsJENTEK SENSORS INC·Filed 2003·Granted Jan 9, 2007·16 cites·6 claims
- 4881US2025044257A1System and method for hole inspectionJENTEK SENSORS INC·Filed 2024·Application pending·0 cites
- 4980US7161351B2Hidden feature characterization using a database of sensor responsesJENTEK SENSORS INC·Filed 2004·Granted Jan 9, 2007·16 cites·29 claims
- 5080US6781387B2Inspection method using penetrant and dielectrometerJENTEK SENSORS INC·Filed 2002·Granted Aug 24, 2004·44 cites·4 claims
Showing the top 50 of 112 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →