Inventor · disambiguated record
Neal C. Jaarsma
Also filed as: JAARSMA NEAL C
6 granted patents·111 citations·filing 1990–2014
80Inventor score
Top patents by PatentIndex Score
6 records- 0189US6587981B1Integrated circuit with scan test structureAGILENT TECHNOLOGIES INC·Filed 1999·Granted Jul 1, 2003·91 cites·25 claims
- 0269US8159241B1Method and apparatus for on-chip adjustment of chip characteristicsJAARSMA NEAL C·Filed 2008·Granted Apr 17, 2012·4 cites·8 claims
- 0359US6751768B2Hierarchical creation of vectors for quiescent current (IDDQ) tests for system-on-chip circuitsAGILENT TECHNOLOGIES INC·Filed 2001·Granted Jun 15, 2004·10 cites·12 claims
- 0447US9443733B2Method and apparatus for authenticating a semiconductor dieMARVELL WORLD TRADE LTD·Filed 2014·Granted Sep 13, 2016·0 cites·20 claims
- 0542US9766966B1Method and apparatus for on-chip adjustment of chip characteristicsJAARSMA NEAL C·Filed 2011·Granted Sep 19, 2017·0 cites·20 claims
- 0634US5130989ASerial and parallel scan technique for improved testing of systolic arraysHEWLETT PACKARD CO·Filed 1990·Granted Jul 14, 1992·6 cites·1 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →