Inventor · disambiguated record
Nelson Kei Leung
Also filed as: LEUNG NELSON · LEUNG NELSON KEI · LEUNG NELSON KEI WAI
5 granted patents·2 pending applications·15 citations·filing 2007–2020
70Inventor score
Top patents by PatentIndex Score
7 records- 0187US11715213B2Apparatus and methods for determining multi-subject performance metrics in a three-dimensional spaceINTEL CORP·Filed 2020·Granted Aug 1, 2023·6 cites·28 claims
- 0284US11416228B2System and method of optimizing instructions for quantum computersUNIV CHICAGO·Filed 2019·Granted Aug 16, 2022·9 cites·21 claims
- 0331US2017045579A1Cpu bist testing of integrated circuits using serial wire debugTEXAS INSTRUMENTS INC·Filed 2015·Application pending·0 cites
- 0430US2009024324A1Method and System for GRR TestingCLARK DOUGLAS W·Filed 2007·Application pending·0 cites
- 0529US9142321B2Testing of non-volatile memory arraysTEXAS INSTRUMENTS INC·Filed 2013·Granted Sep 22, 2015·0 cites·18 claims
- 0626US9691501B2Testing for threshold voltage and bit cell current of non-volatile memory arraysTEXAS INSTRUMENTS INC·Filed 2015·Granted Jun 27, 2017·0 cites·21 claims
- 0726US9081051B2Methods for testing manufactured productsNAHAR AMIT VIJAY·Filed 2011·Granted Jul 14, 2015·0 cites·8 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →