Inventor · disambiguated record
Nick Atchison
Also filed as: ATCHISON NICK
3 granted patents·361 citations·filing 1999–1999
79Inventor score
Technology areasH10P
Files withTEXAS INSTRUMENTS INC3
Top patents by PatentIndex Score
3 records- 0190US6210983B1Method for analyzing probe yield sensitivities to IC designTEXAS INSTRUMENTS INC·Filed 1999·Granted Apr 3, 2001·140 cites·1 claims
- 0289US6393602B1Method of a comprehensive sequential analysis of the yield losses of semiconductor wafersTEXAS INSTRUMENTS INC·Filed 1999·Granted May 21, 2002·135 cites·2 claims
- 0384US6324481B1Method for the calculation of wafer probe yield limits from in-line defect monitor dataTEXAS INSTRUMENTS INC·Filed 1999·Granted Nov 27, 2001·86 cites·1 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →