Inventor · disambiguated record
Niranjan R Hegde
Also filed as: HEGDE NIRANJAN · HEGDE NIRANJAN R
5 granted patents·6 pending applications·2 citations·filing 2019–2025
63Inventor score
Files withTEKTRONIX INC11
Top patents by PatentIndex Score
11 records- 0176US11275131B1Test and measurement instrument for determining maximum flux densityTEKTRONIX INC·Filed 2019·Granted Mar 15, 2022·2 cites·20 claims
- 0271US12092693B2System and method for computing direct quadrature zero resultant drive vector using rotor positionTEKTRONIX INC·Filed 2022·Granted Sep 17, 2024·0 cites·26 claims
- 0367US12498410B2Flexible wide bandgap double pulse testing methodologyTEKTRONIX INC·Filed 2022·Granted Dec 16, 2025·0 cites·18 claims
- 0467US12345755B2Reverse recovery measurements and plotsTEKTRONIX INC·Filed 2022·Granted Jul 1, 2025·0 cites·16 claims
- 0562US2025309905A1Method to identify, isolate and remove the source(s) of jitter affecting reference clock and data using time interval errorTEKTRONIX INC·Filed 2025·Application pending·0 cites
- 0657US12020855B2Test and measurement instrument for determining magnetic core lossesTEKTRONIX INC·Filed 2021·Granted Jun 25, 2024·0 cites·18 claims
- 0755US2025067777A1Bus measurements to calculate and display timing characteristics of bus protocols in test and measurement instrumentsTEKTRONIX INC·Filed 2024·Application pending·0 cites
- 0855US2025062720A1Automated testing of a photovoltaic power system and associated components using an oscilloscopeTEKTRONIX INC·Filed 2024·Application pending·0 cites
- 0953US2024353470A1System and methods to accurately measure dynamic resistance for power devicesTEKTRONIX INC·Filed 2024·Application pending·0 cites
- 1050US2024345166A1Defect analysis of electric motors using reference frames (dqz components)TEKTRONIX INC·Filed 2024·Application pending·0 cites
- 1144US2024044968A1Method and apparatus for determining output charge of wide bandgap devices without hardware modificationTEKTRONIX INC·Filed 2023·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →