Inventor · disambiguated record
Niichi Itoh
Also filed as: ITOH NIICHI
8 granted patents·3 pending applications·65 citations·filing 1999–2006
86Inventor score
Top patents by PatentIndex Score
11 records- 0165US6201758B1Semiconductor memory device permitting time required for writing data to be reducedMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Mar 13, 2001·15 cites·9 claims
- 0263US6128208ASemiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 1999·Granted Oct 3, 2000·19 cites·11 claims
- 0354US6838770B2Semiconductor device, designing method and designing device thereofMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Jan 4, 2005·7 cites·3 claims
- 0452US7026667B2Semiconductor integrated circuit device having clock signal transmission line and wiring method thereofRENESAS TECH CORP·Filed 2002·Granted Apr 11, 2006·3 cites·12 claims
- 0552US6856170B2Clock signal transmission circuitRENESAS TECH CORP·Filed 2003·Granted Feb 15, 2005·6 cites·10 claims
- 0648US6327166B1Semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Dec 4, 2001·3 cites·11 claims
- 0747US7394115B2Semiconductor integrated circuit device having clock signal transmission line and wiring method thereofRENESAS TECH CORP·Filed 2006·Granted Jul 1, 2008·0 cites·4 claims
- 0845US2005246407A1High speed multiplication apparatus of Wallace tree type with high area efficiencyRENESAS TECH CORP·Filed 2005·Application pending·0 cites
- 0944US2005138102A1Arithmetic unitRENESAS TECH CORP·Filed 2004·Application pending·0 cites
- 1040US2001009012A1High speed multiplication apparatus of Wallace tree type with high area efficiencyMITSUBISHI ELECTRIC CORP·Filed 2001·Application pending·0 cites
- 1138US6317865B1Wiring-capacitance improvement aid device aiding in improvement of points having wiring-capacitance attributable error only with layout modification, method thereof, and medium having a program therefor recorded thereinMITSUBISHI ELECTRIC CORP·Filed 1999·Granted Nov 13, 2001·12 cites·15 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →