Inventor · disambiguated record
Nikita Naresh
Also filed as: NARESH NIKITA
11 granted patents·2 pending applications·10 citations·filing 2016–2023
83Inventor score
Files withTEXAS INSTRUMENTS INC13
Top patents by PatentIndex Score
13 records- 0193US10866280B2Scan chain self-testing of lockstep cores on resetTEXAS INSTRUMENTS INC·Filed 2019·Granted Dec 15, 2020·5 cites·20 claims
- 0292US11680984B1Control data registers for scan testingTEXAS INSTRUMENTS INC·Filed 2022·Granted Jun 20, 2023·2 cites·20 claims
- 0383US11555853B2Scan chain self-testing of lockstep cores on resetTEXAS INSTRUMENTS INC·Filed 2020·Granted Jan 17, 2023·1 cites·20 claims
- 0479US11852683B2Scan chain self-testing of lockstep cores on resetTEXAS INSTRUMENTS INC·Filed 2023·Granted Dec 26, 2023·0 cites·20 claims
- 0562US12142337B2System and method for parallel memory testTEXAS INSTRUMENTS INC·Filed 2023·Granted Nov 12, 2024·0 cites·19 claims
- 0660US10460821B2Area efficient parallel test data path for embedded memoriesTEXAS INSTRUMENTS INC·Filed 2018·Granted Oct 29, 2019·1 cites·19 claims
- 0759US10818374B2Testing read-only memory using memory built-in self-test controllerTEXAS INSTRUMENTS INC·Filed 2019·Granted Oct 27, 2020·1 cites·18 claims
- 0857US11521698B2Testing read-only memory using memory built-in self-test controllerTEXAS INSTRUMENTS INC·Filed 2020·Granted Dec 6, 2022·0 cites·18 claims
- 0955US11776656B2System and method for parallel memory testTEXAS INSTRUMENTS INC·Filed 2021·Granted Oct 3, 2023·0 cites·20 claims
- 1045US9899103B2Area efficient parallel test data path for embedded memoriesTEXAS INSTRUMENTS INC·Filed 2017·Granted Feb 20, 2018·0 cites·20 claims
- 1145US2022358230A1Methods and apparatus for using scan operations to protect secure assetsTEXAS INSTRUMENTS INC·Filed 2021·Application pending·0 cites
- 1241US11715544B2System and method for low power memory testTEXAS INSTRUMENTS INC·Filed 2021·Granted Aug 1, 2023·0 cites·20 claims
- 1339US2017125125A1Area-efficient parallel test data path for embedded memoriesTEXAS INSTRUMENTS INC·Filed 2016·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →