Inventor · disambiguated record
Nicholas H. Tripsas
Also filed as: TRIPSAS NICHOLAS · TRIPSAS NICHOLAS H · TRIPSAS NICHOLAS HARRIS
57 granted patents·1,957 citations·filing 1996–2011
99Inventor score
Top patents by PatentIndex Score
57 records- 0199US6674138B1Use of high-k dielectric materials in modified ONO structure for semiconductor devicesADVANCED MICRO DEVICES INC·Filed 2001·Granted Jan 6, 2004·490 cites·16 claims
- 0298US7391064B1Memory device with a selection element and a control line in a substantially similar layerSPANSION LLC·Filed 2004·Granted Jun 24, 2008·110 cites·11 claims
- 0398US6803272B1Use of high-K dielectric material in modified ONO structure for semiconductor devicesADVANCED MICRO DEVICES INC·Filed 2003·Granted Oct 12, 2004·149 cites·20 claims
- 0497US7035141B1Diode array architecture for addressing nanoscale resistive memory arraysSPANSION LLC·Filed 2004·Granted Apr 25, 2006·111 cites·5 claims
- 0595US6639271B1Fully isolated dielectric memory cell structure for a dual bit nitride storage device and process for making sameADVANCED MICRO DEVICES INC·Filed 2001·Granted Oct 28, 2003·99 cites·14 claims
- 0694US6746971B1Method of forming copper sulfide for memory cellADVANCED MICRO DEVICES INC·Filed 2002·Granted Jun 8, 2004·120 cites·20 claims
- 0793US7696017B1Memory device with a selection element and a control line in a substantially similar layerSPANSION LLC·Filed 2008·Granted Apr 13, 2010·81 cites·20 claims
- 0893US7361586B2Preamorphization to minimize void formationSPANSION LLC·Filed 2005·Granted Apr 22, 2008·27 cites·20 claims
- 0993US6630383B1Bi-layer floating gate for improved work function between floating gate and a high-K dielectric layerADVANCED MICRO DEVICES INC·Filed 2002·Granted Oct 7, 2003·74 cites·21 claims
- 1090US6787458B1Polymer memory device formed in via openingADVANCED MICRO DEVICES INC·Filed 2003·Granted Sep 7, 2004·63 cites·20 claims
- 1190US6753247B1Method(s) facilitating formation of memory cell(s) and patterned conductiveADVANCED MICRO DEVICES INC·Filed 2002·Granted Jun 22, 2004·53 cites·26 claims
- 1290US6420702B1Non-charging critical dimension SEM metrology standardADVANCED MICRO DEVICES INC·Filed 2000·Granted Jul 16, 2002·33 cites·22 claims
- 1389US8049334B1Buried silicide local interconnect with sidewall spacers and method for making the sameADVANCED MICRO DEVICES INC·Filed 2010·Granted Nov 1, 2011·8 cites·20 claims
- 1488US6977389B2Planar polymer memory deviceADVANCED MICRO DEVICES INC·Filed 2003·Granted Dec 20, 2005·51 cites·28 claims
- 1588US6870183B2Stacked organic memory devices and methods of operating and fabricatingADVANCED MICRO DEVICES INC·Filed 2002·Granted Mar 22, 2005·29 cites·31 claims
- 1687US7465956B1Stacked organic memory devices and methods of operating and fabricatingADVANCED MICRO DEVICES INC·Filed 2005·Granted Dec 16, 2008·11 cites·11 claims
- 1783US7561465B2Methods and systems for recovering data in a nonvolatile memory arrayADVANCED MICRO DEVICES INC·Filed 2007·Granted Jul 14, 2009·17 cites·10 claims
- 1883US6979837B2Stacked organic memory devices and methods of operating and fabricatingADVANCED MICRO DEVICES INC·Filed 2004·Granted Dec 27, 2005·19 cites·19 claims
- 1983US6455888B1Memory cell structure for elimination of oxynitride (ONO) etch residue and polysilicon stringersADVANCED MICRO DEVICES INC·Filed 2000·Granted Sep 24, 2002·10 cites·11 claims
- 2082US6861307B2Fully isolated dielectric memory cell structure for a dual bit nitride storage device and process for making sameADVANCED MICRO DEVICES INC·Filed 2003·Granted Mar 1, 2005·26 cites·20 claims
- 2182US6355933B1Ion source and method for using sameADVANCED MICRO DEVICES INC·Filed 1999·Granted Mar 12, 2002·36 cites·17 claims
- 2280US6753570B1Memory device and method of makingADVANCED MICRO DEVICES INC·Filed 2002·Granted Jun 22, 2004·27 cites·19 claims
- 2379US6852586B1Self assembly of conducting polymer for formation of polymer memory cellADVANCED MICRO DEVICES INC·Filed 2003·Granted Feb 8, 2005·26 cites·8 claims
- 2479US6783591B1Laser thermal annealing method for high dielectric constant gate oxide filmsADVANCED MICRO DEVICES INC·Filed 2002·Granted Aug 31, 2004·20 cites·15 claims
- 2578US8368219B2Buried silicide local interconnect with sidewall spacers and method for making the sameADVANCED MICRO DEVICES INC·Filed 2011·Granted Feb 5, 2013·3 cites·20 claims
- 2677US6872643B1Implant damage removal by laser thermal annealingADVANCED MICRO DEVICES INC·Filed 2003·Granted Mar 29, 2005·18 cites·4 claims
- 2777US5888867ANon-uniform threshold voltage adjustment in flash eproms through gate work function alterationADVANCED MICRO DEVICES INC·Filed 1998·Granted Mar 30, 1999·49 cites·14 claims
- 2876US7468525B2Test structures for development of metal-insulator-metal (MIM) devicesSPANSION LLC·Filed 2006·Granted Dec 23, 2008·4 cites·8 claims
- 2976US6627945B1Memory device and method of makingADVANCED MICRO DEVICES INC·Filed 2002·Granted Sep 30, 2003·21 cites·22 claims
- 3075US6735123B1High density dual bit flash memory cell with non planar structureADVANCED MICRO DEVICES INC·Filed 2002·Granted May 11, 2004·20 cites·7 claims
- 3174US7786003B1Buried silicide local interconnect with sidewall spacers and method for making the sameADVANCED MICRO DEVICES INC·Filed 2005·Granted Aug 31, 2010·5 cites·11 claims
- 3274US6579778B1Source bus formation for a flash memory using silicideADVANCED MICRO DEVICES INC·Filed 2000·Granted Jun 17, 2003·15 cites·23 claims
- 3367US8003436B2Stacked organic memory devices and methods of operating and fabricatingSPANSION LLC·Filed 2008·Granted Aug 23, 2011·2 cites·20 claims
- 3464US7232765B1Utilization of a Ta-containing cap over copper to facilitate concurrent formation of copper vias and memory element structuresADVANCED MICRO DEVICES INC·Filed 2004·Granted Jun 19, 2007·11 cites·20 claims
- 3563US8012673B1Processing a copolymer to form a polymer memory cellSPANSION LLC·Filed 2005·Granted Sep 6, 2011·1 cites·20 claims
- 3663US6034395ASemiconductor device having a reduced height floating gateADVANCED MICRO DEVICES INC·Filed 1998·Granted Mar 7, 2000·21 cites·9 claims
- 3760US6667243B1Etch damage repair with thermal annealingADVANCED MICRO DEVICES INC·Filed 2002·Granted Dec 23, 2003·6 cites·11 claims
- 3860US6548855B1Non-volatile memory dielectric as charge pump dielectricADVANCED MICRO DEVICES INC·Filed 2002·Granted Apr 15, 2003·7 cites·6 claims
- 3959US6030868AElimination of oxynitride (ONO) etch residue and polysilicon stringers through isolation of floating gates on adjacent bitlines by polysilicon oxidationADVANCED MICRO DEVICES INC·Filed 1998·Granted Feb 29, 2000·16 cites·13 claims
- 4058US6500713B1Method for repairing damage to charge trapping dielectric layer from bit line implantationADVANCED MICRO DEVICES INC·Filed 2001·Granted Dec 31, 2002·5 cites·15 claims
- 4156US7001807B1Fully isolated dielectric memory cell structure for a dual bit nitride storage device and process for making sameADVANCED MICRO DEVICES INC·Filed 2004·Granted Feb 21, 2006·6 cites·7 claims
- 4256US6211020B1Process for fabricating a common source region in memory devicesADVANCED MICRO DEVICES INC·Filed 1998·Granted Apr 3, 2001·13 cites·10 claims
- 4354US6025240AMethod and system for using a spacer to offset implant damage and reduce lateral diffusion in flash memory devicesADVANCED MICRO DEVICES INC·Filed 1997·Granted Feb 15, 2000·12 cites·25 claims
- 4451US8084770B2Test structures for development of metal-insulator-metal (MIM) devicesAVANZINO STEVEN·Filed 2008·Granted Dec 27, 2011·0 cites·7 claims
- 4546US7220642B2Protection of active layers of memory cells during processing of other elementsSPANSION LLC·Filed 2004·Granted May 22, 2007·2 cites·15 claims
- 4645US7632706B2System and method for processing an organic memory cellSPANSION LLC·Filed 2005·Granted Dec 15, 2009·0 cites·14 claims
- 4745US7199416B1Systems and methods for a memory and/or selection element formed within a recess in a metal lineSPANSION LLC·Filed 2004·Granted Apr 3, 2007·2 cites·17 claims
- 4843US6410956B1Method and system for using a spacer to offset implant damage and reduce lateral diffusion in flash memory devicesADVANCED MICRO DEVICES INC·Filed 2000·Granted Jun 25, 2002·1 cites·17 claims
- 4942US6043120AElimination of oxynitride (ONO) etch residue and polysilicon stringers through isolation of floating gates on adjacent bitlines by polysilicon oxidationADVANCED MICRO DEVICES INC·Filed 1998·Granted Mar 28, 2000·6 cites·17 claims
- 5042US6015717AMethod for monitoring rapid thermal process integrityADVANCED MICRO DEVICES INC·Filed 1998·Granted Jan 18, 2000·8 cites·18 claims
Showing the top 50 of 57 patent records by PatentIndex Score.
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