Inventor · disambiguated record
Nobuyuki Akiyama
Also filed as: AKIYAMA NOBUYUKI · KUNI ASAHIRO
38 granted patents·4 pending applications·1,772 citations·filing 1976–2017
98Inventor score
Top patents by PatentIndex Score
42 records- 0198US4115762AAlignment pattern detecting apparatusHITACHI LTD·Filed 1977·Granted Sep 19, 1978·90 cites·5 claims
- 0297US4475223AExposure process and systemHITACHI LTD·Filed 1982·Granted Oct 2, 1984·141 cites·11 claims
- 0397US4449818AMethod of inspecting microscopic surface defectsHITACHI METALS LTD·Filed 1982·Granted May 22, 1984·124 cites·8 claims
- 0496US4614427AAutomatic contaminants detection apparatusHITACHI LTD·Filed 1984·Granted Sep 30, 1986·141 cites·11 claims
- 0596US4391511ALight exposure device and methodHITACHI LTD·Filed 1981·Granted Jul 5, 1983·153 cites·23 claims
- 0693US4343553AShape testing apparatusHITACHI LTD·Filed 1980·Granted Aug 10, 1982·57 cites·6 claims
- 0792US5278012AMethod for producing thin film multilayer substrate, and method and apparatus for detecting circuit conductor pattern of the substrateHITACHI LTD·Filed 1992·Granted Jan 11, 1994·237 cites·23 claims
- 0892US4447731AExterior view examination apparatusHITACHI LTD·Filed 1981·Granted May 8, 1984·45 cites·7 claims
- 0991US5046847AMethod for detecting foreign matter and device for realizing sameHITACHI LTD·Filed 1988·Granted Sep 10, 1991·100 cites·33 claims
- 1091US4153371AMethod and apparatus for reduction-projection type mask alignmentHITACHI LTD·Filed 1977·Granted May 8, 1979·55 cites·9 claims
- 1187US5098191AMethod of inspecting reticles and apparatus thereforHITACHI LTD·Filed 1989·Granted Mar 24, 1992·57 cites·18 claims
- 1287US4508453APattern detection systemHITACHI LTD·Filed 1982·Granted Apr 2, 1985·48 cites·11 claims
- 1387US4423331AMethod and apparatus for inspecting specimen surfaceHITACHI LTD·Filed 1981·Granted Dec 27, 1983·52 cites·6 claims
- 1485US4925755AMethod of correcting defect in circuit patternHITACHI LTD·Filed 1988·Granted May 15, 1990·40 cites·6 claims
- 1585US4095905ASurface-defect detecting deviceHITACHI LTD·Filed 1976·Granted Jun 20, 1978·33 cites·26 claims
- 1682USD382217SFire detectorNITTAN CO LTD·Filed 1996·Granted Aug 12, 1997·25 cites·1 claims
- 1782US4541715AApparatus for detecting contaminants on the reticle of exposure systemHITACHI LTD·Filed 1983·Granted Sep 17, 1985·33 cites·20 claims
- 1876US4460273ATest apparatus for defects of plateHITACHI LTD·Filed 1981·Granted Jul 17, 1984·30 cites·15 claims
- 1975US10106691B2Metal paste for gas sensor electrode formationTANAKA PRECIOUS METAL IND·Filed 2017·Granted Oct 23, 2018·1 cites·18 claims
- 2075US4362389AMethod and apparatus for projection type mask alignmentHITACHI LTD·Filed 1980·Granted Dec 7, 1982·29 cites·7 claims
- 2173US4788577ASubstrate surface deflecting deviceHITACHI LTD·Filed 1988·Granted Nov 29, 1988·22 cites·4 claims
- 2272US4242702AApparatus for automatically checking external appearance of objectHITACHI LTD·Filed 1977·Granted Dec 30, 1980·21 cites·23 claims
- 2371US8201973B2Flame detectorKUDOH AKIHISA·Filed 2009·Granted Jun 19, 2012·10 cites·9 claims
- 2471USD651926SFire detectorAKIYAMA NOBUYUKI·Filed 2011·Granted Jan 10, 2012·23 cites·1 claims
- 2571USD621287SFire detectorNITTAN CO LTD·Filed 2008·Granted Aug 10, 2010·17 cites·1 claims
- 2670US4938598AMethod and apparatus for position detection on reduction-projection systemHITACHI LTD·Filed 1988·Granted Jul 3, 1990·20 cites·12 claims
- 2769US9758680B2Metal paste for gas sensor electrode formationTANAKA PRECIOUS METAL IND·Filed 2014·Granted Sep 12, 2017·1 cites·10 claims
- 2868US4965454AMethod and apparatus for detecting foreign particleHITACHI LTD·Filed 1989·Granted Oct 23, 1990·27 cites·13 claims
- 2964US5245270AEnergy storage systemICHINOSE HIROOMI·Filed 1991·Granted Sep 14, 1993·45 cites·11 claims
- 3056US6057775AIonization smoke detectorNITTAN CO LTD·Filed 1997·Granted May 2, 2000·25 cites·10 claims
- 3156US4433235AFocusing position detecting device in optical magnifying and observing apparatusHITACHI LTD·Filed 1981·Granted Feb 21, 1984·14 cites·9 claims
- 3255US4491787AFlatness measuring deviceHITACHI LTD·Filed 1981·Granted Jan 1, 1985·12 cites·7 claims
- 3353US4403336AX-Ray exposure apparatusHITACHI LTD·Filed 1982·Granted Sep 6, 1983·17 cites·5 claims
- 3452US4504045AWafer transforming deviceHITACHI LTD·Filed 1982·Granted Mar 12, 1985·16 cites·9 claims
- 3547US10366963B2Noble metal paste for bonding of semiconductor elementTANAKA PRECIOUS METAL IND·Filed 2016·Granted Jul 30, 2019·0 cites·11 claims
- 3641US4647196ASurface flaw detection methodHITACHI METALS LTD·Filed 1985·Granted Mar 3, 1987·8 cites·4 claims
- 3741US2019041350A1Metal paste for gas sensor electrode formationTANAKA PRECIOUS METAL IND·Filed 2017·Application pending·0 cites
- 3839US9539671B2Precious metal paste for bonding semiconductor elementMIYAIRI MASAYUKI·Filed 2011·Granted Jan 10, 2017·0 cites·11 claims
- 3939US2019094173A1Gas Sensor Electrode and Method for Producing SameTANAKA PRECIOUS METAL IND·Filed 2017·Application pending·0 cites
- 4035US2012160325A1Method of manufacturing silicon thin film, method of manufacturing silicon thin-film photovoltaic cell, silicon thin film, and silicon thin-film photovoltaic cellAKIYAMA NOBUYUKI·Filed 2011·Application pending·0 cites
- 4133US5747364AMethod of making semiconductor wafers and semiconductor wafers made therebyKOMATSU DENSHI KINZOKU KK·Filed 1997·Granted May 5, 1998·3 cites·3 claims
- 4233US2016357470A1Computer readable medium, information processing apparatus, and methodFUJITSU LTD·Filed 2016·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →