Inventor · disambiguated record
Nobutoshi Aoki
Also filed as: AOKI NOBUTOSHI
49 granted patents·16 pending applications·625 citations·filing 1998–2018
98Inventor score
Top patents by PatentIndex Score
65 records- 0197US7186598B2Semiconductor device and manufacturing method of the sameTOSHIBA KK·Filed 2005·Granted Mar 6, 2007·121 cites·7 claims
- 0297US6930360B2Semiconductor device and manufacturing method of the sameTOSHIBA KK·Filed 2003·Granted Aug 16, 2005·139 cites·21 claims
- 0395US7391068B2Semiconductor deviceTOSHIBA KK·Filed 2006·Granted Jun 24, 2008·42 cites·8 claims
- 0493US9136468B2Nonvolatile semiconductor memory deviceTOSHIBA KK·Filed 2013·Granted Sep 15, 2015·10 cites·20 claims
- 0592US9030881B2Nonvolatile semiconductor memory deviceTOSHIBA KK·Filed 2013·Granted May 12, 2015·15 cites·19 claims
- 0692US8633535B2Nonvolatile semiconductor memoryMATSUO KOUJI·Filed 2011·Granted Jan 21, 2014·16 cites·20 claims
- 0789US8035199B2Semiconductor device and method for manufacturing the sameTOSHIBA KK·Filed 2009·Granted Oct 11, 2011·14 cites·16 claims
- 0889US7989856B2Fin transistorTOSHIBA KK·Filed 2008·Granted Aug 2, 2011·17 cites·18 claims
- 0989US7539055B2Non-volatile semiconductor memory and method for controlling a non-volatile semiconductor memoryTOSHIBA KK·Filed 2007·Granted May 26, 2009·15 cites·6 claims
- 1086US7459748B2Semiconductor memory deviceTOSHIBA KK·Filed 2006·Granted Dec 2, 2008·17 cites·13 claims
- 1185US8809931B2Nonvolatile semiconductor memory deviceTOSHIBA KK·Filed 2013·Granted Aug 19, 2014·9 cites·13 claims
- 1285US7456096B2Method of manufacturing silicide layer for semiconductor deviceTOSHIBA KK·Filed 2006·Granted Nov 25, 2008·8 cites·6 claims
- 1385US7393748B2Method of fabricating a semiconductor memory deviceTOSHIBA KK·Filed 2006·Granted Jul 1, 2008·10 cites·17 claims
- 1484US8354706B2Semiconductor memory deviceTOSHIBA KK·Filed 2010·Granted Jan 15, 2013·8 cites·17 claims
- 1583US9379164B2Integrated circuit deviceTOSHIBA KK·Filed 2015·Granted Jun 28, 2016·5 cites·23 claims
- 1683US7528447B2Non-volatile semiconductor memory and method for controlling a non-volatile semiconductor memoryTOSHIBA KK·Filed 2006·Granted May 5, 2009·9 cites·14 claims
- 1781US10276590B2Method for manufacturing a semiconductor device including a vertical channel between stacked electrode layers and an insulating layerTOSHIBA MEMORY CORP·Filed 2018·Granted Apr 30, 2019·3 cites·8 claims
- 1881US6207591B1Method and equipment for manufacturing semiconductor deviceTOSHIBA KK·Filed 1998·Granted Mar 27, 2001·41 cites·26 claims
- 1979US8420467B2Semiconductor device and method for manufacturing the sameIZUMIDA TAKASHI·Filed 2011·Granted Apr 16, 2013·4 cites·9 claims
- 2078US6744104B1Semiconductor integrated circuit including insulated gate field effect transistor and method of manufacturing the sameTOSHIBA KK·Filed 1999·Granted Jun 1, 2004·42 cites·28 claims
- 2175US9825100B2Nonvolatile semiconductor memory deviceTOSHIBA MEMORY CORP·Filed 2016·Granted Nov 21, 2017·3 cites·12 claims
- 2274US8134203B2Nonvolatile semiconductor memory deviceIZUMIDA TAKASHI·Filed 2009·Granted Mar 13, 2012·4 cites·9 claims
- 2373US8686488B2Nonvolatile semiconductor memory device and method of manufacturing the sameKONDO MASAKI·Filed 2012·Granted Apr 1, 2014·4 cites·16 claims
- 2473US7923788B2Semiconductor deviceTOSHIBA KK·Filed 2008·Granted Apr 12, 2011·5 cites·20 claims
- 2572US8680612B2Semiconductor device and manufacturing method thereofIZUMIDA TAKASHI·Filed 2012·Granted Mar 25, 2014·3 cites·20 claims
- 2670US8289782B2Semiconductor memory deviceIZUMIDA TAKASHI·Filed 2010·Granted Oct 16, 2012·3 cites·20 claims
- 2769US7902612B2Semiconductor device and method of manufacturing the sameTOSHIBA KK·Filed 2008·Granted Mar 8, 2011·2 cites·13 claims
- 2868US8964459B2Magnetoresistive element and writing method of magnetic memoryTOSHIBA KK·Filed 2013·Granted Feb 24, 2015·3 cites·17 claims
- 2967US9019777B2Nonvolatile semiconductor memory device and operating method of the sameTOSHIBA KK·Filed 2013·Granted Apr 28, 2015·3 cites·20 claims
- 3066US7842998B2Nonvolatile semiconductor memory device and method for manufacturing the sameTOSHIBA KK·Filed 2008·Granted Nov 30, 2010·2 cites·19 claims
- 3164US9536616B1Non-volatile memory device and method for reading out dataTOSHIBA KK·Filed 2015·Granted Jan 3, 2017·1 cites·12 claims
- 3263US7629243B2Method for manufacturing semiconductor deviceTOSHIBA KK·Filed 2006·Granted Dec 8, 2009·1 cites·10 claims
- 3363US7358198B2Semiconductor device and method for fabricating sameTOSHIBA KK·Filed 2005·Granted Apr 15, 2008·2 cites·14 claims
- 3463US6697771B1Semiconductor device manufacturing system and the method thereofTOSHIBA KK·Filed 2000·Granted Feb 24, 2004·8 cites·28 claims
- 3562US7755134B2Nonvolatile semiconductor memory deviceTOSHIBA KK·Filed 2007·Granted Jul 13, 2010·2 cites·6 claims
- 3661US8901633B2Semiconductor storage device and method for manufacturing the sameTOSHIBA KK·Filed 2013·Granted Dec 2, 2014·1 cites·11 claims
- 3761US6516237B1System for and method of preparing manufacturing process specifications and production control systemTOSHIBA KK·Filed 1998·Granted Feb 4, 2003·28 cites·22 claims
- 3860US8258562B2Semiconductor device having tri-gate structure and manufacturing method thereofIZUMIDA TAKASHI·Filed 2009·Granted Sep 4, 2012·1 cites·4 claims
- 3955US7795121B2Method for manufacturing semiconductor deviceTOSHIBA KK·Filed 2008·Granted Sep 14, 2010·0 cites·11 claims
- 4052US8614477B2Nonvolatile semiconductor memory deviceIZUMIDA TAKASHI·Filed 2012·Granted Dec 24, 2013·0 cites·3 claims
- 4152US8575684B2Nonvolatile semiconductor memory deviceIZUMIDA TAKASHI·Filed 2012·Granted Nov 5, 2013·0 cites·8 claims
- 4252US6980942B2Method of simulation of production process of semiconductor device and simulator thereofTOSHIBA KK·Filed 2001·Granted Dec 27, 2005·3 cites·21 claims
- 4350US7732277B2Semiconductor device and method of fabricating the sameTOSHIBA KK·Filed 2007·Granted Jun 8, 2010·0 cites·15 claims
- 4448US9917099B2Semiconductor device having vertical channel between stacked electrode layers and insulating layersTOSHIBA MEMORY CORP·Filed 2016·Granted Mar 13, 2018·0 cites·12 claims
- 4546US2010207187A1Nonvolatile semiconductor memory deviceTOSHIBA KK·Filed 2009·Application pending·0 cites
- 4645US2015261897A1Simulation method, simulation apparatus, and computer-readable recording mediumTOSHIBA KK·Filed 2014·Application pending·0 cites
- 4745US2010006920A1Semiconductor memory device and manufacturing method thereofTOSHIBA KK·Filed 2009·Application pending·0 cites
- 4844US7160818B2Semiconductor device and method for fabricating sameTOSHIBA KK·Filed 2004·Granted Jan 9, 2007·1 cites·12 claims
- 4944US2007164360A1Semiconductor device and method of fabricating the sameTOSHIBA KK·Filed 2006·Application pending·0 cites
- 5043US7586163B2Semiconductor device having an electrode containing boron and manufacturing method thereofTOSHIBA KK·Filed 2005·Granted Sep 8, 2009·0 cites·11 claims
Showing the top 50 of 65 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →