Inventor · disambiguated record
Noyoung Chung
Also filed as: CHUNG Noyoung
13 granted patents·5 pending applications·14 citations·filing 2016–2024
83Inventor score
Files withSAMSUNG ELECTRONICS CO LTD18
Top patents by PatentIndex Score
18 records- 0192US9996658B2Method of manufacturing a semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted Jun 12, 2018·11 cites·20 claims
- 0285US12299368B2Method of manufacturing a semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted May 13, 2025·1 cites·20 claims
- 0378US10031410B2Method for fabricating mask by performing optical proximity correctionSAMSUNG ELECTRONICS CO LTD·Filed 2016·Granted Jul 24, 2018·2 cites·20 claims
- 0466US2025216795A1Method of using lithography apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0563US2025216793A1Method of configuring extreme ultraviolet illumination system and extreme ultraviolet exposure method using the illumination systemSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0661US11698581B2Method and computing device for manufacturing semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Jul 11, 2023·0 cites·19 claims
- 0758US2024219824A1Reflective mask for extreme ultraviolet lithography and a method of fabricating a semiconductor device using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2023·Application pending·0 cites
- 0857US12437138B2Layout method of semiconductor chip, semiconductor chip manufacturing method and computing device using sameSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Oct 7, 2025·0 cites·20 claims
- 0955US2024193755A1Pattern defect inspection device and pattern defect inspection methodSAMSUNG ELECTRONICS CO LTD·Filed 2023·Application pending·0 cites
- 1053US2023135975A1Semiconductor devicesSAMSUNG ELECTRONICS CO LTD·Filed 2022·Application pending·0 cites
- 1152US12306531B2Lithography and method of fabricating semiconductor device using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted May 20, 2025·0 cites·20 claims
- 1251US12393123B2Optical proximity correction method, mask manufacturing method and semiconductor chip manufacturing method using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Aug 19, 2025·0 cites·17 claims
- 1350US12159832B2Integrated circuit deviceSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Dec 3, 2024·0 cites·17 claims
- 1449US11733604B2Optical proximity correction method and method of fabricating a semiconductor device using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Aug 22, 2023·0 cites·20 claims
- 1547US12396213B2Semiconductor device and method of fabricating the sameSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Aug 19, 2025·0 cites·18 claims
- 1647US11500283B2Mask layout correction method and a method for fabricating semiconductor devices using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2020·Granted Nov 15, 2022·0 cites·19 claims
- 1747US11092885B2Manufacturing methods of semiconductor devicesSAMSUNG ELECTRONICS CO LTD·Filed 2020·Granted Aug 17, 2021·0 cites·18 claims
- 1846US12506077B2Semiconductor devices and methods of fabricating the sameSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Dec 23, 2025·0 cites·14 claims
Join the waitlist — get patent alerts
Get an alert when Noyoung Chung files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →