Inventor · disambiguated record
Noboru Higashi
Also filed as: HIGASHI NOBORU
13 granted patents·8 pending applications·75 citations·filing 1993–2023
89Inventor score
Top patents by PatentIndex Score
21 records- 0174US7978331B2Attenuated total reflection optical probe and apparatus therewith for spectroscopic measurement of aqueous solutionKURASHIKI BOSEKI KK·Filed 2007·Granted Jul 12, 2011·5 cites·13 claims
- 0273US6943951B2Optical component and dispersion compensation methodOYOKODEN LAB CO LTD·Filed 2001·Granted Sep 13, 2005·26 cites·22 claims
- 0372US8646174B2Device and method for mounting electronic componentsKAIDA KENICHI·Filed 2010·Granted Feb 11, 2014·5 cites·1 claims
- 0472US7791729B2Attenuated total reflection probe and spectrometer therewithKURASHIKI BOSEKI KK·Filed 2008·Granted Sep 7, 2010·4 cites·7 claims
- 0569US8712572B2Electronic component mounting machine and operating instruction method for the sameHIGASHI NOBORU·Filed 2009·Granted Apr 29, 2014·5 cites·2 claims
- 0656US6765667B2Method for inspection of circuit boards and apparatus for inspection of circuit boardsMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2001·Granted Jul 20, 2004·2 cites·18 claims
- 0756US5427100AMethod for determining median lineHITACHI LTD·Filed 1993·Granted Jun 27, 1995·18 cites·7 claims
- 0853US2025167020A1Substrate processing status monitoring device and substrate processing status monitoring methodKURASHIKI BOSEKI KK·Filed 2023·Application pending·0 cites
- 0952US2015021491A1Method and apparatus for measuring concentration of advanced-oxidation active speciesKURASHIKI BOSEKI KK·Filed 2014·Application pending·0 cites
- 1051US10929970B2Component mounting system and trace data acquisition methodPANASONIC IP MAN CO LTD·Filed 2019·Granted Feb 23, 2021·0 cites·11 claims
- 1150US2011115899A1Component mount systemPANASONIC CORP·Filed 2009·Application pending·0 cites
- 1249US2011007146A1Substrate inspection device and substrate inspection methodPANASONIC CORP·Filed 2009·Application pending·0 cites
- 1348US2014065717A1Method and apparatus for measuring concentration of advanced-oxidation active speciesKURASHIKI BOSEKI KK·Filed 2013·Application pending·0 cites
- 1446US8453526B2Method of inspecting mount state of componentKAIDA KENICHI·Filed 2008·Granted Jun 4, 2013·0 cites·8 claims
- 1543US2010096554A1Device and method for evaluating cleanlinessSHIROTA KOJI·Filed 2008·Application pending·0 cites
- 1641US2005100274A1Light dispersion compensating element and composite type light dispersion compensating element using that element and light dispersion compensating method using that elementFiled 2001·Application pending·0 cites
- 1740US8390816B2Method for attenuated total reflection far ultraviolet spectroscopy and an apparatus for measuring concentrations therewithHIGASHI NOBORU·Filed 2009·Granted Mar 5, 2013·0 cites·13 claims
- 1840US2021111435A1Electrode sheet, all-solid battery, method for manufacturing electrode sheet, and method for manufacturing all-solid batteryKURASHIKI BOSEKI KK·Filed 2018·Application pending·0 cites
- 1937US10153182B2Substrate processing apparatusHIGASHI NOBORU·Filed 2012·Granted Dec 11, 2018·0 cites·4 claims
- 2035US5748193AFlat pattern image generation of internal structure dataHITACHI LTD·Filed 1995·Granted May 5, 1998·7 cites·3 claims
- 2132US5991031AOptical density measuring apparatusKURASHIKI BOSEKI KK·Filed 1998·Granted Nov 23, 1999·3 cites·6 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →