Inventor · disambiguated record
Nobuhiro Ishikawa
Also filed as: ISHIKAWA NOBUHIRO
29 granted patents·3 pending applications·335 citations·filing 1997–2023
96Inventor score
Top patents by PatentIndex Score
32 records- 0195US9746303B2Coordinate measuring machine and method for calculating correction matrix by coordinate measuring machineMITUTOYO CORP·Filed 2015·Granted Aug 29, 2017·13 cites·8 claims
- 0293US10415949B2Measuring probeMITUTOYO CORP·Filed 2017·Granted Sep 17, 2019·10 cites·12 claims
- 0391US10429167B2Coordinate correction method and coordinate measuring machineMITUTOYO CORP·Filed 2017·Granted Oct 1, 2019·7 cites·13 claims
- 0491US10422636B2Coordinate measuring machine and coordinate correction methodMITUTOYO CORP·Filed 2017·Granted Sep 24, 2019·7 cites·6 claims
- 0591US6044569AMeasuring method and measuring instrumentMITUTOYO CORP·Filed 1998·Granted Apr 4, 2000·102 cites·16 claims
- 0690US9464877B2Shape measuring apparatus and shape measurement error correction methodMITUTOYO CORP·Filed 2015·Granted Oct 11, 2016·7 cites·15 claims
- 0789US8229694B2Coordinate measuring machineNAKAGAWA HIDEYUKI·Filed 2009·Granted Jul 24, 2012·23 cites·7 claims
- 0885US10429166B2Coordinate measuring machine and coordinate correction methodMITUTOYO CORP·Filed 2017·Granted Oct 1, 2019·4 cites·10 claims
- 0985US9097504B2Shape measuring machine and method of correcting shape measurement errorMITUTOYO CORP·Filed 2013·Granted Aug 4, 2015·7 cites·10 claims
- 1085US7660688B2Surface-profile measuring instrumentMITUTOYO CORP·Filed 2007·Granted Feb 9, 2010·18 cites·4 claims
- 1184US9719779B2Form measuring machine and form measuring methodMITUTOYO CORP·Filed 2015·Granted Aug 1, 2017·4 cites·7 claims
- 1284US9683839B2Method of correcting measurement error of shape measuring apparatus, and shape measuring apparatusMITUTOYO CORP·Filed 2015·Granted Jun 20, 2017·4 cites·14 claims
- 1384US9062958B2Image sensor, attitude detector, contact probe, and multi-sensing probeMITUTOYO CORP·Filed 2013·Granted Jun 23, 2015·7 cites·9 claims
- 1483US7319909B2Position control device, measuring device and machining deviceMITUTOYO CORP·Filed 2006·Granted Jan 15, 2008·13 cites·15 claims
- 1582US7464481B2Measuring apparatus, method of measuring surface texture and computer readable medium having program for measuring surface textureMITUTOYO CORP·Filed 2007·Granted Dec 16, 2008·12 cites·16 claims
- 1680US9091522B2Shape measuring machine and method of correcting shape measurement errorMITUTOYO CORP·Filed 2013·Granted Jul 28, 2015·5 cites·10 claims
- 1779US8332173B2Coordinate measuring machineISHIKAWA NOBUHIRO·Filed 2009·Granted Dec 11, 2012·13 cites·12 claims
- 1876US10393495B2Measuring probeMITUTOYO CORP·Filed 2017·Granted Aug 27, 2019·2 cites·19 claims
- 1970US5949257ADC level transition detecting circuit for sensor devicesMITUTOYO CORP·Filed 1997·Granted Sep 7, 1999·24 cites·7 claims
- 2063US6507404B1Method and apparatus for measuring optical wavelengthMITUTOYO CORP·Filed 2000·Granted Jan 14, 2003·11 cites·16 claims
- 2163US6360176B1Touch signal probeMITUTOYO CORP·Filed 1999·Granted Mar 19, 2002·25 cites·19 claims
- 2262US2025216781A1Negative type photosensitive resin composition, dry film, cured product, and electronic componentTAIYO HOLDINGS CO LTD·Filed 2023·Application pending·0 cites
- 2359US10006803B2Sensor signal contact detector circuitMITUTOYO CORP·Filed 2015·Granted Jun 26, 2018·1 cites·4 claims
- 2456US12054611B2Poly(phenylene ether), curable composition containing poly(phenylene ether), dry film, prepreg, cured object, laminate, and electronic componentTAIYO HOLDINGS CO LTD·Filed 2019·Granted Aug 6, 2024·0 cites·19 claims
- 2552US12447725B2Curable resin multilayer body, dry film, cured product and electronic componentTAIYO HOLDINGS CO LTD·Filed 2022·Granted Oct 21, 2025·0 cites·6 claims
- 2652US6937070B2Amplitude-detecting method and circuitMITUTOYO CORP·Filed 2001·Granted Aug 30, 2005·5 cites·10 claims
- 2748US8134325B2ControllerNAKAGAWA HIDEYUKI·Filed 2009·Granted Mar 13, 2012·0 cites·7 claims
- 2847US2022380538A1Curable composition including polyphenylene ether, dry film, prepreg, cured product, laminated board, and electronic componentTAIYO HOLDINGS CO LTD·Filed 2020·Application pending·0 cites
- 2944US7471056B2Control deviceMITUTOYO CORP·Filed 2005·Granted Dec 30, 2008·0 cites·12 claims
- 3039US2012204420A1Method for manufacturing wiring boardASANO TOSHIYA·Filed 2012·Application pending·0 cites
- 3136US5922964AAmplitude detecting deviceMITUTOYO CORP·Filed 1997·Granted Jul 13, 1999·7 cites·11 claims
- 3232US6215225B1Non-directional touch signal probeMITUTOYO CORP·Filed 1998·Granted Apr 10, 2001·4 cites·13 claims
Join the waitlist — get patent alerts
Get an alert when Nobuhiro Ishikawa files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →