Inventor · disambiguated record
Norihiko Kaneko
Also filed as: KANEKO NORIHIKO
9 granted patents·3 pending applications·138 citations·filing 1996–2024
85Inventor score
Top patents by PatentIndex Score
12 records- 0190US7888238B2Method of manufacturing semiconductor device having semiconductor formation regions of different planar sizesCASIO COMPUTER CO LTD·Filed 2008·Granted Feb 15, 2011·18 cites·22 claims
- 0290US5834894ACarrier injection type organic electro-luminescent device which emits light in response to an application of a voltageCASIO COMPUTER CO LTD·Filed 1996·Granted Nov 10, 1998·104 cites·19 claims
- 0388US11640078B2Light control deviceTOPPAN INC·Filed 2022·Granted May 2, 2023·2 cites·10 claims
- 0479US7619306B2Semiconductor device having projecting electrode formed by electrolytic plating, and manufacturing method thereofCASIO COMPUTER CO LTD·Filed 2007·Granted Nov 17, 2009·9 cites·2 claims
- 0565US12198324B2Evaluation index calculation device, evaluation index calculation method, and evaluation index calculation programTOPPAN INC·Filed 2022·Granted Jan 14, 2025·0 cites·11 claims
- 0664US7838394B2Method of manufacturing semiconductor deviceCASIO COMPUTER CO LTD·Filed 2007·Granted Nov 23, 2010·2 cites·10 claims
- 0758US7944064B2Semiconductor device having alignment post electrode and method of manufacturing the sameCASIO COMPUTER CO LTD·Filed 2007·Granted May 17, 2011·2 cites·11 claims
- 0847US2024353704A1Display deviceTOPPAN HOLDINGS INC·Filed 2024·Application pending·0 cites
- 0945US2010052165A1Semiconductor device including columnar electrodes having planar size greater than that of connection pad portion of wiring line, and manufacturing method thereofCASIO COMPUTER CO LTD·Filed 2009·Application pending·0 cites
- 1044US8097941B2Semiconductor device having projecting electrode formed by electrolytic plating, and manufacturing method thereofKANEKO NORIHIKO·Filed 2009·Granted Jan 17, 2012·0 cites·7 claims
- 1132US6941908B2Internal combustion engineMITSUBISHI MOTOR ENG·Filed 2004·Granted Sep 13, 2005·1 cites·10 claims
- 1232US2015235845A1Method of manufacturing semiconductor deviceTERA PROBE INC·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →