Inventor · disambiguated record
Nobuyuki Kawakami
Also filed as: KAWAKAMI NOBUYUKI
22 granted patents·14 pending applications·360 citations·filing 2000–2015
95Inventor score
Top patents by PatentIndex Score
36 records- 0195US7411298B2Source/drain electrodes, thin-film transistor substrates, manufacture methods thereof, and display devicesKOBE STEEL LTD·Filed 2006·Granted Aug 12, 2008·59 cites·15 claims
- 0295US7193241B2Ultraviolet sensor and method for manufacturing the sameKOBE STEEL LTD·Filed 2005·Granted Mar 20, 2007·51 cites·3 claims
- 0394US7067903B2Heat spreader and semiconductor device and package using the sameKOBE STEEL LTD·Filed 2003·Granted Jun 27, 2006·103 cites·5 claims
- 0488US8535997B2Wiring structure, thin film transistor substrate, method for manufacturing thin film transistor substrate, and display deviceKAWAKAMI NOBUYUKI·Filed 2009·Granted Sep 17, 2013·21 cites·7 claims
- 0586US7781767B2Thin film transistor substrate and display deviceKOBE STEEL LTD·Filed 2007·Granted Aug 24, 2010·15 cites·5 claims
- 0684US6703316B2Method and system for processing substrateKOBE STEEL LTD·Filed 2002·Granted Mar 9, 2004·30 cites·18 claims
- 0779US6364953B1Method and apparatus for making aerogel filmKOBE STEEL LTD·Filed 2000·Granted Apr 2, 2002·24 cites·14 claims
- 0878US8163143B2Al-Ni-La-Si system Al-based alloy sputtering target and process for producing the sameTAKAGI KATSUTOSHI·Filed 2008·Granted Apr 24, 2012·4 cites·2 claims
- 0975US8786090B2Al alloy film for display device, display device, and sputtering targetGOTO HIROSHI·Filed 2007·Granted Jul 22, 2014·6 cites·26 claims
- 1073US6524429B1Method of forming buried wiring, and apparatus for processing substratumSONY CORP·Filed 2000·Granted Feb 25, 2003·14 cites·10 claims
- 1172US8053083B2Layered structure and its manufacturing methodKOBE STEEL LTD·Filed 2008·Granted Nov 8, 2011·5 cites·20 claims
- 1271US8299614B2Interconnection structure, a thin film transistor substrate, and a manufacturing method thereof, as well as a display deviceKAWAKAMI NOBUYUKI·Filed 2009·Granted Oct 30, 2012·4 cites·20 claims
- 1366US9816944B2Method for evaluating oxide semiconductor thin film, method for managing quality of oxide semiconductor thin film, and evaluation element and evaluation device used in above evaluation methodKOBE STEEL LTD·Filed 2014·Granted Nov 14, 2017·1 cites·20 claims
- 1461US8057882B2Membrane structure element and method for manufacturing sameHIRANO TAKAYUKI·Filed 2007·Granted Nov 15, 2011·2 cites·2 claims
- 1560US6804900B2Method for drying microstructure memberKOBE STEEL LTD·Filed 2003·Granted Oct 19, 2004·9 cites·4 claims
- 1654US7064352B2Diamond semiconductor device and method for manufacturing the sameKOBE STEEL LTD·Filed 2004·Granted Jun 20, 2006·6 cites·10 claims
- 1751US2011248272A1Organic el display device reflective anode and method for manufacturing the sameKOBE STEEL LTD·Filed 2009·Application pending·0 cites
- 1848US7209088B2Feed antenna including dielectric waveguideKOBE STEEL LTD·Filed 2004·Granted Apr 24, 2007·6 cites·23 claims
- 1947US2009017255A1Dielectric line and production method thereforKOBE STEEL LTD·Filed 2008·Application pending·0 cites
- 2046US2006001029A1Diamond sensorKOBE STEEL LTD·Filed 2005·Application pending·0 cites
- 2144US2015301081A1Electrical contact member and inspection connection deviceKOBE STEEL LTD·Filed 2013·Application pending·0 cites
- 2243US2005051930A1Fine structure composite and drying method of fine structure using the sameKOBE STEEL LTD·Filed 2004·Application pending·0 cites
- 2342US6777321B2Method of forming buried wiringSONY CORP·Filed 2002·Granted Aug 17, 2004·0 cites·10 claims
- 2442US2004198627A1Process and apparatus for removing residues from the microstructure of an objectKOBE STEEL LTD·Filed 2004·Application pending·0 cites
- 2541US10203367B2Quality evaluation method for laminate having protective layer on surface of oxide semiconductor thin film and quality control method for oxide semiconductor thin filmKOBE STEEL LTD·Filed 2015·Granted Feb 12, 2019·0 cites·13 claims
- 2641US9780005B2Method for evaluating quality of oxide semiconductor thin film and laminated body having protective film on surface of oxide semiconductor thin film, and method for managing quality of oxide semiconductor thin filmKOBE STEEL LTD·Filed 2015·Granted Oct 3, 2017·0 cites·14 claims
- 2741US7432038B2Dielectric line and production method thereforKOBE STEEL LTD·Filed 2004·Granted Oct 7, 2008·0 cites·13 claims
- 2841US2006051970A1Method for forming porous film and porous film formed by the methodKOBE STEEL LTD·Filed 2005·Application pending·0 cites
- 2940US2004038060A1Fine structure composite and drying method of fine structure using the sameKOBE STEEL LTD·Filed 2003·Application pending·0 cites
- 3039US8217397B2Thin film transistor substrate and display deviceOCHI MOTOTAKA·Filed 2009·Granted Jul 10, 2012·0 cites·15 claims
- 3139US2002164873A1Process and apparatus for removing residues from the microstructure of an objectFiled 2002·Application pending·0 cites
- 3239US2005119360A1Method for producing porous materialKOBE STEEL LTD·Filed 2004·Application pending·0 cites
- 3339US2003106573A1Process and apparatus for removing residues from the microstructure of an objectFiled 2002·Application pending·0 cites
- 3437US2007077409A1Porous substrate with smooth surface and production method thereofUNIV KYOTO·Filed 2006·Application pending·0 cites
- 3534US2003183251A1Process for drying an object having microstructure and the object obtained by the sameKABUSHISKI KAISHA KOBE SEIKO S·Filed 2003·Application pending·0 cites
- 3634US2002184788A1Process for drying an object having microstructure and the object obtained by the sameFiled 2002·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →