Inventor · disambiguated record
Nobumi Kodama
Also filed as: KODAMA NOBUMI
10 granted patents·142 citations·filing 1986–2005
90Inventor score
Technology areasG11C
Files withFUJITSU LTD10
Top patents by PatentIndex Score
10 records- 0185US7200059B2Semiconductor memory and burn-in test method of semiconductor memoryFUJITSU LTD·Filed 2005·Granted Apr 3, 2007·19 cites·10 claims
- 0268US4740926ASemiconductor memory deviceFUJITSU LTD·Filed 1986·Granted Apr 26, 1988·24 cites·9 claims
- 0365US4771407ASemiconductor integrated circuit having function for switching operational mode of internal circuitFUJITSU LTD·Filed 1987·Granted Sep 13, 1988·23 cites·13 claims
- 0460US4704706ABooster circuitFUJITSU LTD·Filed 1986·Granted Nov 3, 1987·18 cites·8 claims
- 0556US4742486ASemiconductor integrated circuit having function for switching operational mode of internal circuitFUJITSU LTD·Filed 1986·Granted May 3, 1988·15 cites·9 claims
- 0655US7107504B2Test apparatus for semiconductor deviceFUJITSU LTD·Filed 2002·Granted Sep 12, 2006·11 cites·9 claims
- 0747US4787067ASemiconductor dynamic memory device having improved refreshingFUJITSU LTD·Filed 1986·Granted Nov 22, 1988·10 cites·7 claims
- 0843US4716549ASemiconductor memory device having a circuit for compensating for discriminating voltage of memory cellsFUJITSU LTD·Filed 1986·Granted Dec 29, 1987·8 cites·7 claims
- 0941US4896302ASemiconductor memory device having common driver circuits for plural memory cell arraysFUJITSU LTD·Filed 1988·Granted Jan 23, 1990·7 cites·4 claims
- 1040US4807193ASemiconductor memory device with a detection circuit to detect word line potentialFUJITSU LTD·Filed 1987·Granted Feb 21, 1989·7 cites·7 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →