Inventor · disambiguated record
Noriyuki Kodama
Also filed as: KODAMA NORIYUKI
15 granted patents·2 pending applications·428 citations·filing 1992–2007
94Inventor score
Top patents by PatentIndex Score
17 records- 0190US6137149ASemiconductor device having raised source-drains and method of fabricating the sameNEC CORP·Filed 1997·Granted Oct 24, 2000·95 cites·7 claims
- 0287US7098510B2Multifinger-type electrostatic discharge protection elementNEC ELECTRONICS CORP·Filed 2004·Granted Aug 29, 2006·35 cites·13 claims
- 0382US7595537B2MOS type semiconductor device having electrostatic discharge protection arrangementNEC ELECTRONICS CORP·Filed 2005·Granted Sep 29, 2009·12 cites·20 claims
- 0477US6713818B2Electrostatic discharge protection deviceNEC ELECTRONICS CORP·Filed 2003·Granted Mar 30, 2004·24 cites·16 claims
- 0576US5967794AMethod for fabricating a field effect transistor having elevated source/drain regionsNEC CORP·Filed 1997·Granted Oct 19, 1999·49 cites·21 claims
- 0674US7332748B2Electro-static discharge protection deviceNEC ELECTRONICS CORP·Filed 2003·Granted Feb 19, 2008·17 cites·12 claims
- 0773US5953605AFabrication process of semiconductor deviceNEC CORP·Filed 1997·Granted Sep 14, 1999·47 cites·15 claims
- 0872US7875902B2Electro-static discharge protection deviceRENESAS ELECTRONICS CORP·Filed 2007·Granted Jan 25, 2011·4 cites·4 claims
- 0971US7109533B2Electrostatic discharge protection deviceNEC ELECTRONICS CORP·Filed 2003·Granted Sep 19, 2006·17 cites·33 claims
- 1069US5458225ACoin discriminating apparatusANRITSU CORP·Filed 1992·Granted Oct 17, 1995·46 cites·17 claims
- 1168US7196377B2MOS type semiconductor device having electrostatic discharge protection arrangementNEC ELECTRONICS CORP·Filed 2005·Granted Mar 27, 2007·4 cites·18 claims
- 1265US5716891AFabrication process of semiconductor deviceNEC CORP·Filed 1996·Granted Feb 10, 1998·30 cites·14 claims
- 1355US5452785ACoin diameter discriminating apparatusANRITSU CORP·Filed 1994·Granted Sep 26, 1995·23 cites·3 claims
- 1454US5541119AManufacturing method of active circuit elements integrated type liquid crystal displayNEC CORP·Filed 1994·Granted Jul 30, 1996·24 cites·2 claims
- 1545US6715345B2Coaxial probe with cantilever and scanning micro-wave microscope including the sameNEC CORP·Filed 2001·Granted Apr 6, 2004·1 cites·25 claims
- 1641US2006157703A1Charged plate,CDM simulator and test methodNEC CORP·Filed 2006·Application pending·0 cites
- 1734US2002186016A1Electrification quantity measurement apparatus, electrification quantity measurement method, static electricity discharge detection apparatus, and static electricity discharge detection methodFiled 2002·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Noriyuki Kodama files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →