Inventor · disambiguated record
Noriyuki Kondo
Also filed as: KONDO NORIYUKI
11 granted patents·504 citations·filing 1985–2011
92Inventor score
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11 records- 0195US5120966AMethod of and apparatus for measuring film thicknessDAINIPPON SCREEN MFG·Filed 1991·Granted Jun 9, 1992·151 cites·3 claims
- 0295US4984894AMethod of and apparatus for measuring film thicknessDAINIPPON SCREEN MFG·Filed 1989·Granted Jan 15, 1991·125 cites·15 claims
- 0393US7206074B2Apparatus and method for measuring spectral reflectance and apparatus for measuring film thicknessDAINIPPON SCREEN MFG·Filed 2005·Granted Apr 17, 2007·43 cites·20 claims
- 0475US5101111AMethod of measuring thickness of film with a reference sample having a known reflectanceDAINIPPON SCREEN MFG·Filed 1990·Granted Mar 31, 1992·37 cites·4 claims
- 0574US4676647AFilm thickness measuring device and methodDAINIPPON SCREEN MFG·Filed 1985·Granted Jun 30, 1987·30 cites·13 claims
- 0664US4659936ALine width measuring device and methodDAINIPPON SCREEN MFG·Filed 1985·Granted Apr 21, 1987·22 cites·12 claims
- 0762US6104864AMoving image judgingPLUSMIC CORP·Filed 1997·Granted Aug 15, 2000·43 cites·10 claims
- 0862US5314831AMethod of and apparatus for evaluating crystal rate in silicon thin filmDAINIPPON SCREEN MFG·Filed 1992·Granted May 24, 1994·35 cites·11 claims
- 0957US4988198AMethod and apparatus for measuring microlevel differenceDAINIPPON SCREEN MFG·Filed 1988·Granted Jan 29, 1991·16 cites·2 claims
- 1054US7140395B2Brake hoseTOYODA GOSEI KK·Filed 2006·Granted Nov 28, 2006·2 cites·8 claims
- 1130US8899459B2Breaking apparatus and breaking method for substrate made of brittle materialKONDO NORIYUKI·Filed 2011·Granted Dec 2, 2014·0 cites·7 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →