Inventor · disambiguated record
Noriyasu Kumazaki
Also filed as: KUMAZAKI NORIYASU
23 granted patents·3 pending applications·73 citations·filing 2002–2024
94Inventor score
Top patents by PatentIndex Score
26 records- 0190US10957404B2Memory device which generates operation voltages in parallel with reception of an addressTOSHIBA MEMORY CORP·Filed 2019·Granted Mar 23, 2021·7 cites·18 claims
- 0290US2025046384A1Memory device which generates operation voltages in parallel with reception of an addressKIOXIA CORP·Filed 2024·Application pending·0 cites
- 0382US11257551B2Memory device which generates operation voltages in parallel with reception of an addressTOSHIBA MEMORY CORP·Filed 2021·Granted Feb 22, 2022·1 cites·20 claims
- 0478US8432744B2Semiconductor storage device with a well control circuitUMEZAWA AKIRA·Filed 2011·Granted Apr 30, 2013·8 cites·20 claims
- 0576US12159677B2Memory device which generates operation voltages in parallel with reception of an addressKIOXIA CORP·Filed 2023·Granted Dec 3, 2024·0 cites·19 claims
- 0673US11915760B2Semiconductor storage deviceKIOXIA CORP·Filed 2023·Granted Feb 27, 2024·0 cites·15 claims
- 0773US7573306B2Semiconductor memory device, power supply detector and semiconductor deviceTOSHIBA KK·Filed 2007·Granted Aug 11, 2009·7 cites·12 claims
- 0872US10896735B2Semiconductor memory deviceTOSHIBA MEMORY CORP·Filed 2019·Granted Jan 19, 2021·3 cites·20 claims
- 0970US11705210B2Memory device which generates operation voltages in parallel with reception of an addressKIOXIA CORP·Filed 2022·Granted Jul 18, 2023·0 cites·18 claims
- 1069US11657874B2Semiconductor storage deviceKIOXIA CORP·Filed 2021·Granted May 23, 2023·0 cites·13 claims
- 1168US8559234B2Semiconductor memory deviceKUMAZAKI NORIYASU·Filed 2012·Granted Oct 15, 2013·4 cites·15 claims
- 1266US6768691B2Semiconductor integrated circuit and memory systemTOSHIBA KK·Filed 2002·Granted Jul 27, 2004·14 cites·19 claims
- 1365US10930357B2Semiconductor storage device having a temperature sensor that generates a temperature signal based on which applied voltages are generatedTOSHIBA MEMORY CORP·Filed 2019·Granted Feb 23, 2021·2 cites·8 claims
- 1464US11152069B2Semiconductor storage deviceTOSHIBA MEMORY CORP·Filed 2019·Granted Oct 19, 2021·1 cites·8 claims
- 1562US8400838B2Semiconductor storage device and boosting circuitKUMAZAKI NORIYASU·Filed 2011·Granted Mar 19, 2013·4 cites·20 claims
- 1660US9196375B2Semiconductor storage deviceTOSHIBA KK·Filed 2013·Granted Nov 24, 2015·2 cites·18 claims
- 1760US8988138B1Semiconductor deviceTOSHIBA KK·Filed 2014·Granted Mar 24, 2015·2 cites·12 claims
- 1860US6885606B2Synchronous semiconductor memory device with a plurality of memory banks and method of controlling the sameTOSHIBA KK·Filed 2003·Granted Apr 26, 2005·11 cites·16 claims
- 1958US8238154B2Nonvolatile semiconductor memory with charge storage layers and control gatesSAKO MARIO·Filed 2009·Granted Aug 7, 2012·4 cites·20 claims
- 2055US7920439B2Semiconductor memory device using a bandgap reference circuit and a reference voltage generator for operating under a low power supply voltageTOSHIBA KK·Filed 2007·Granted Apr 5, 2011·3 cites·10 claims
- 2148US11862293B2Semiconductor memory device for reducing effect of leakage currentKIOXIA CORP·Filed 2021·Granted Jan 2, 2024·0 cites·20 claims
- 2245US10360981B2Semiconductor memory device for providing different voltages to grouped memory blocksTOSHIBA MEMORY CORP·Filed 2017·Granted Jul 23, 2019·0 cites·6 claims
- 2340US2009261893A1Semiconductor device including cell transistor and cell capacitorKUMAZAKI NORIYASU·Filed 2009·Application pending·0 cites
- 2435US8976606B2Voltage generating circuit and semiconductor device including the voltage generating circuitTOSHIBA KK·Filed 2013·Granted Mar 10, 2015·0 cites·20 claims
- 2534US2012249187A1Current source circuitKUMAZAKI NORIYASU·Filed 2012·Application pending·0 cites
- 2630US8310878B2Semiconductor storage device and boosting circuitKUMAZAKI NORIYASU·Filed 2010·Granted Nov 13, 2012·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →