Inventor · disambiguated record
Nobuyuki Naka
Also filed as: NAKA NOBUYUKI
5 granted patents·59 citations·filing 2005–2017
77Inventor score
Top patents by PatentIndex Score
5 records- 0191US7327444B2Substrate inspection apparatus and methodHORIBA LTD·Filed 2005·Granted Feb 5, 2008·34 cites·22 claims
- 0285US7295307B2Method of and apparatus for measuring stress of semiconductor materialHORIBA LTD·Filed 2005·Granted Nov 13, 2007·19 cites·20 claims
- 0371US7623223B2Stress measurement methodHORIBA LTD·Filed 2007·Granted Nov 24, 2009·5 cites·6 claims
- 0450US10900905B2Probe manufacturing method and probeUNIV KYOTO·Filed 2017·Granted Jan 26, 2021·0 cites·15 claims
- 0542US7668668B2Stress component measurement methodHORIBA LTD·Filed 2007·Granted Feb 23, 2010·1 cites·4 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →