Inventor · disambiguated record
Norimasa Nishimura
Also filed as: NISHIMURA NORIMASA
4 granted patents·233 citations·filing 1998–2000
82Inventor score
Technology areasH01J
Files withHITACHI LTD4
Top patents by PatentIndex Score
4 records- 0196US6465781B1Method and apparatus for inspecting or measuring a sample based on charged-particle beam imaging, and a charged-particle beam apparatusHITACHI LTD·Filed 2000·Granted Oct 15, 2002·85 cites·25 claims
- 0293US6303932B1Method and its apparatus for detecting a secondary electron beam image and a method and its apparatus for processing by using focused charged particle beamHITACHI LTD·Filed 1998·Granted Oct 16, 2001·84 cites·19 claims
- 0384US6476387B1Method and apparatus for observing or processing and analyzing using a charged beamHITACHI LTD·Filed 1999·Granted Nov 5, 2002·44 cites·22 claims
- 0467US6507029B1Sample processing apparatus and method for removing charge on sample through light irradiationHITACHI LTD·Filed 1999·Granted Jan 14, 2003·20 cites·9 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →