Inventor · disambiguated record
Nobuaki Ogushi
Also filed as: OGUSHI NOBUAKI
16 granted patents·3 pending applications·429 citations·filing 1995–2006
95Inventor score
Top patents by PatentIndex Score
19 records- 0195US6385497B1Remote maintenance systemCANON KK·Filed 1997·Granted May 7, 2002·195 cites·82 claims
- 0292US7062343B2Remote maintenance systemCANON KK·Filed 2005·Granted Jun 13, 2006·37 cites·13 claims
- 0390US6897456B2Differential pumping system and exposure apparatusCANON KK·Filed 2003·Granted May 24, 2005·37 cites·15 claims
- 0485US6867843B2Debris removing system for use in X-ray light sourceCANON KK·Filed 2002·Granted Mar 15, 2005·35 cites·13 claims
- 0583US6963786B2Remote maintenance systemCANON KK·Filed 2001·Granted Nov 8, 2005·23 cites·64 claims
- 0683US6892109B2Remote maintenance systemCANON KK·Filed 2001·Granted May 10, 2005·23 cites·10 claims
- 0781US6980872B2Information providing method and systemCANON KK·Filed 2001·Granted Dec 27, 2005·25 cites·4 claims
- 0880US7805279B2Remote maintenance systemCANON KK·Filed 2006·Granted Sep 28, 2010·10 cites·11 claims
- 0970US7225041B2Information providing method and systemCANON KK·Filed 2005·Granted May 29, 2007·2 cites·39 claims
- 1070US6795161B2Exposure apparatus, method of manufacturing semiconductor devices and plant thereforCANON KK·Filed 2001·Granted Sep 21, 2004·11 cites·20 claims
- 1168US6957112B2Industrial machine management system and methodCANON KK·Filed 2001·Granted Oct 18, 2005·12 cites·10 claims
- 1246US2005209720A1Industrial machine management system, and methodCANON KK·Filed 2005·Application pending·0 cites
- 1342US6665371B1Synchrotron radiation measurement apparatus, X-ray exposure apparatus, and device manufacturing methodCANON KK·Filed 2000·Granted Dec 16, 2003·2 cites·27 claims
- 1440US2005270509A1Measuring apparatus, exposure apparatus having the same, and device manufacturing methodOGUSHI NOBUAKI·Filed 2005·Application pending·0 cites
- 1539US6009144AX-ray system and X-ray exposure apparatusCANON KK·Filed 1998·Granted Dec 28, 1999·6 cites·11 claims
- 1636US2003012373A1Semiconductor manufacturing system and information management methodCANON KK·Filed 2002·Application pending·0 cites
- 1735US6160865AX-ray exposure apparatus with synchrotron radiation intensity measurementCANON KK·Filed 1998·Granted Dec 12, 2000·4 cites·8 claims
- 1835US5596618AExposure apparatus and device manufacturing method using the sameCANON KK·Filed 1995·Granted Jan 21, 1997·4 cites·13 claims
- 1932US5760878AExposure apparatus and alignment discrimination methodCANON KK·Filed 1996·Granted Jun 2, 1998·3 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →