Inventor · disambiguated record
Nobuaki Sakai
Also filed as: SAKAI NOBUAKI
25 granted patents·8 pending applications·211 citations·filing 1994–2024
94Inventor score
Files withOLYMPUS CORP16SEIKO EPSON CORP8OLYMPUS OPTICAL CO6AISIN CORP2FURUKAWA AUTOMOTIVE SYSTEMS INC1
Top patents by PatentIndex Score
33 records- 0188US5386720AIntegrated AFM sensorOLYMPUS OPTICAL CO·Filed 1994·Granted Feb 7, 1995·83 cites·21 claims
- 0283US9968017B2Electromagnetic shielding tubeFURUKAWA AUTOMOTIVE SYSTEMS INC·Filed 2015·Granted May 8, 2018·10 cites·5 claims
- 0382US9453856B2Scanning probe microscope and scanning probe microscopyOLYMPUS CORP·Filed 2015·Granted Sep 27, 2016·2 cites·12 claims
- 0480US10639887B2Printing apparatusSEIKO EPSON CORP·Filed 2017·Granted May 5, 2020·3 cites·10 claims
- 0570US12384167B2Recording deviceSEIKO EPSON CORP·Filed 2023·Granted Aug 12, 2025·0 cites·4 claims
- 0668US5929643AScanning probe microscope for measuring the electrical properties of the surface of an electrically conductive sampleOLYMPUS OPTICAL CO·Filed 1996·Granted Jul 27, 1999·38 cites·15 claims
- 0766US9625491B2Scanning mechanism and scanning probe microscopeOLYMPUS CORP·Filed 2015·Granted Apr 18, 2017·1 cites·25 claims
- 0866US6775039B2Driving circuit for an optical scannerOLYMPUS CORP·Filed 2002·Granted Aug 10, 2004·11 cites·24 claims
- 0965US9170272B2Scanning mechanism and scanning probe microscopeOLYMPUS CORP·Filed 2014·Granted Oct 27, 2015·1 cites·24 claims
- 1065US6097197AScanning probe microscopeOLYMPUS OPTICAL CO·Filed 1997·Granted Aug 1, 2000·34 cites·13 claims
- 1161US10928417B2Atomic force microscope, atomic force microscopy, and controlling method of an atomic force microscopyOLYMPUS CORP·Filed 2019·Granted Feb 23, 2021·0 cites·14 claims
- 1260US6980359B2Microscope systemOLYMPUS OPTICAL CO·Filed 2004·Granted Dec 27, 2005·6 cites·4 claims
- 1359US9977049B2Scanning probe microscope and control method thereofOLYMPUS CORP·Filed 2016·Granted May 22, 2018·0 cites·12 claims
- 1457US9519005B2Scanning mechanism and scanning probe microscopeOLYMPUS CORP·Filed 2015·Granted Dec 13, 2016·0 cites·27 claims
- 1557US7085030B2Optical scanner driving apparatus and optical scanner driving methodOLYMPUS CORP·Filed 2002·Granted Aug 1, 2006·6 cites·9 claims
- 1657US2024336075A1Platen, printing deviceSEIKO EPSON CORP·Filed 2024·Application pending·0 cites
- 1756US12157355B2Guide railAISIN CORP·Filed 2022·Granted Dec 3, 2024·0 cites·4 claims
- 1856US2024239116A1Medium support device and recording deviceSEIKO EPSON CORP·Filed 2023·Application pending·0 cites
- 1954US10161959B2Atomic force microscope and control method of the sameOLYMPUS CORP·Filed 2017·Granted Dec 25, 2018·0 cites·14 claims
- 2052US9335341B2Scanning probe microscope and control method thereofOLYMPUS CORP·Filed 2014·Granted May 10, 2016·0 cites·17 claims
- 2152US5543614AScanning probe microscope capable of suppressing probe vibration caused by feedback controlOLYMPUS OPTICAL CO·Filed 1994·Granted Aug 6, 1996·16 cites·21 claims
- 2251US12037833B2Slide door driving deviceAISIN CORP·Filed 2022·Granted Jul 16, 2024·0 cites·11 claims
- 2349US10107833B2Atomic force microscope and control method of the sameOLYMPUS CORP·Filed 2018·Granted Oct 23, 2018·0 cites·12 claims
- 2448US11292260B2Liquid storing device and recording apparatusSEIKO EPSON CORP·Filed 2020·Granted Apr 5, 2022·0 cites·10 claims
- 2547US2024179253A1Recording device frame and recording deviceSEIKO EPSON CORP·Filed 2023·Application pending·0 cites
- 2643US11685177B2Recording deviceSEIKO EPSON CORP·Filed 2021·Granted Jun 27, 2023·0 cites·6 claims
- 2743US9347969B2Compound microscopeOLYMPUS CORP·Filed 2014·Granted May 24, 2016·0 cites·8 claims
- 2841US2013271544A1Cutting device and recording apparatusSEIKO EPSON CORP·Filed 2013·Application pending·0 cites
- 2941US2015047080A1Compound microscope with scanning probe microscope and optical microscope combined, control device of the same, control method and control program, and storage mediumOLYMPUS CORP·Filed 2014·Application pending·0 cites
- 3040US2002176161A1Microscope systemOLYMPUS OPTICAL CO·Filed 2002·Application pending·0 cites
- 3138US2019011478A1Observation method using compound microscope including an inverted optical microscope and atomic force microscope, program to perform observation method, and compound microscopeOLYMPUS CORP·Filed 2018·Application pending·0 cites
- 3237US9482690B2Scanning probe microscopeOLYMPUS CORP·Filed 2015·Granted Nov 1, 2016·0 cites·10 claims
- 3337US2018074092A1Information acquiring method in atomic force microscopeOLYMPUS CORP·Filed 2017·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →