Inventor · disambiguated record
Nobuyoshi Shimizu
Also filed as: SHIMIZU NOBUYOSHI
86 granted patents·17 pending applications·552 citations·filing 1982–2016
99Inventor score
Top patents by PatentIndex Score
103 records- 0194US7312414B2Key switch deviceFUJITSU COMPONENT LTD·Filed 2007·Granted Dec 25, 2007·30 cites·23 claims
- 0292US8049001B2Probe, probe set, probe carrier, and testing methodCANON KK·Filed 2008·Granted Nov 1, 2011·13 cites·7 claims
- 0392US7906286B2Probe set, probe carrier, and method for determining and identifying fungusCANON KK·Filed 2008·Granted Mar 15, 2011·22 cites·10 claims
- 0492US5049809ASensing device utilizing magneto electric transducersFUJITSU LTD·Filed 1988·Granted Sep 17, 1991·83 cites·35 claims
- 0590US9645318B2Optical connector and method for manufacturing optical connectorFUJITSU COMPONENT LTD·Filed 2015·Granted May 9, 2017·8 cites·6 claims
- 0690US4967598AAcceleration sensorFUJITSU LTD·Filed 1988·Granted Nov 6, 1990·59 cites·13 claims
- 0789US7863000B2Probe, probe set and probe carrier for detecting Candida lusitaniaeCANON KK·Filed 2008·Granted Jan 4, 2011·7 cites·8 claims
- 0887US9217760B2Current sensorFUJITSU COMPONENT LTD·Filed 2013·Granted Dec 22, 2015·6 cites·18 claims
- 0987US7858315B2Probe, probe set, probe carrier, and testing methodCANON KK·Filed 2008·Granted Dec 28, 2010·4 cites·4 claims
- 1087US7858314B2Probe, probe set, probe carrier, and testing methodCANON KK·Filed 2008·Granted Dec 28, 2010·4 cites·4 claims
- 1187US5585719AMagnetoresistance effect element sensor and an electronic circuit thereforFUJITSU LTD·Filed 1994·Granted Dec 17, 1996·61 cites·16 claims
- 1285US7888026B2Probe, probe set, probe carrier, and testing method for detecting DNA of Candida parapsilosisCANON KK·Filed 2008·Granted Feb 15, 2011·3 cites·3 claims
- 1382US7495656B2Actuator that provides tactile informationFUJITSU COMPONENT LTD·Filed 2006·Granted Feb 24, 2009·11 cites·5 claims
- 1481US8599565B2Touchscreen panel, electronic apparatus and method of fabricating touchscreen panelKONDOH KOICHI·Filed 2010·Granted Dec 3, 2013·6 cites·14 claims
- 1580US8698738B2Position detection deviceSAKURAI SATOSHI·Filed 2011·Granted Apr 15, 2014·5 cites·11 claims
- 1680US7795418B2Probe, probe set, probe carrier, and testing methodCANON KK·Filed 2008·Granted Sep 14, 2010·8 cites·4 claims
- 1780US7443384B2Coordinates input deviceFUJITSU COMPONENT LTD·Filed 2004·Granted Oct 28, 2008·28 cites·24 claims
- 1879US7940063B2Coordinate detecting device and methodFUJITSU COMPONENT LTD·Filed 2009·Granted May 10, 2011·9 cites·9 claims
- 1979US5055786ABarber-pole magnetoresistive magnetic field sensorFUJITSU LTD·Filed 1990·Granted Oct 8, 1991·35 cites·4 claims
- 2077US7573361B2Solenoid actuator and biaxial actuatorFUJITSU COMPONENT LTD·Filed 2006·Granted Aug 11, 2009·7 cites·3 claims
- 2175US7226911B2Hair keratin-associated proteinsUNIV KEIO·Filed 2004·Granted Jun 5, 2007·2 cites·4 claims
- 2274US7242395B2Input device and driving device thereofFUJITSU COMPONENT LTD·Filed 2003·Granted Jul 10, 2007·19 cites·25 claims
- 2374US5342547AAgents for controlling underwater fouling organismsMARINE BIOTECH INST CO LTD·Filed 1993·Granted Aug 30, 1994·18 cites·9 claims
- 2472US8259447B2Display apparatus and adjustment mechanismSHIMIZU NOBUYOSHI·Filed 2010·Granted Sep 4, 2012·2 cites·12 claims
- 2571US9290818B2Probe, probe set, probe carrier, and testing methodCANON KK·Filed 2013·Granted Mar 22, 2016·0 cites·7 claims
- 2671US9029513B2Anti-EGFR antibody and use thereofSHIMIZU NOBUYOSHI·Filed 2011·Granted May 12, 2015·1 cites·9 claims
- 2770US8003321B2Method of detecting DNA of arthroderma gypseumCANON KK·Filed 2008·Granted Aug 23, 2011·0 cites·2 claims
- 2870US7998675B2Probe, probe set, probe carrier, and testing method for detecting DNA of Arthroderma incurvatumCANON KK·Filed 2008·Granted Aug 16, 2011·0 cites·2 claims
- 2970US2008299569A1Probe, probe set, probe carrier, and testing methodCANON KK·Filed 2008·Application pending·0 cites
- 3070US2008293062A1Probe, probe set, probe carrier, and testing methodCANON KK·Filed 2008·Application pending·0 cites
- 3170US2008305487A1Probe, probe set, probe carrier, and testing methodCANON KK·Filed 2008·Application pending·0 cites
- 3269US9459720B2Touch panelFUJITSU COMPONENT LTD·Filed 2013·Granted Oct 4, 2016·2 cites·13 claims
- 3368US9373202B2Vehicle information recording apparatusDENSO CORP·Filed 2014·Granted Jun 21, 2016·6 cites·11 claims
- 3467US9280249B2Position detecting method for touchscreen panel, touchscreen panel, and electronic apparatusKONDOH KOICHI·Filed 2010·Granted Mar 8, 2016·2 cites·8 claims
- 3567US8530163B2Probe, probe set, probe carrier, and testing methodTOMATSU NOBUHIRO·Filed 2008·Granted Sep 10, 2013·0 cites·6 claims
- 3667US8344124B2Probe, probe set, probe carrier, and testing methodCANON KK·Filed 2012·Granted Jan 1, 2013·0 cites·4 claims
- 3767US7960539B2Probe, probe set, probe carrier, and testing methodCANON KK·Filed 2008·Granted Jun 14, 2011·0 cites·7 claims
- 3866US8778664B2Probe, probe set, probe carrier, and testing methodTOMATSU NOBUHIRO·Filed 2012·Granted Jul 15, 2014·0 cites·5 claims
- 3966US8178320B2Artificial antibody library with super-repertorySHIMIZU NOBUYOSHI·Filed 2002·Granted May 15, 2012·2 cites·28 claims
- 4066US8144128B2Touch panel and coordinates detecting method using touch panelNAKAJIMA TAKASHI·Filed 2010·Granted Mar 27, 2012·2 cites·15 claims
- 4166US8039607B2Probe, probe set, probe carrier, and testing methodCANON KK·Filed 2008·Granted Oct 18, 2011·0 cites·7 claims
- 4266US8034918B2Probe, probe set, probe carrier, and testing methodCANON KK·Filed 2008·Granted Oct 11, 2011·0 cites·7 claims
- 4366US7985544B2Probe, probe set, and probe carrier for detecting DNA of Trichophyton verrucosumCANON KK·Filed 2008·Granted Jul 26, 2011·0 cites·8 claims
- 4466US7960538B2Probe, probe set, probe carrier, and testing methodCANON KK·Filed 2008·Granted Jun 14, 2011·0 cites·7 claims
- 4566US7935809B2Probe, probe set, probe carrier, and testing methodCANON KK·Filed 2008·Granted May 3, 2011·0 cites·7 claims
- 4666US4511631AMetallic chromium-nickel-hydrated chromium oxide-coated tin free steel and process for the production thereofTOYO KOHAN CO LTD·Filed 1984·Granted Apr 16, 1985·11 cites·21 claims
- 4766US2008293061A1Probe, probe set, probe carrier, and testing methodCANON KK·Filed 2008·Application pending·0 cites
- 4866US2008287312A1Probe, probe set, probe carrier, and testing methodCANON KK·Filed 2008·Application pending·0 cites
- 4965US7434835B2Airbag system having multiple collision determining circuitsDENSO CORP·Filed 2006·Granted Oct 14, 2008·4 cites·1 claims
- 5063US6972651B2Switch operable under a predetermined condition, external magnetic field generating unit, combination of such a switch and an external magnetic field generating unit and electronic apparatus incorporating the sameTAKAMISAWA ELECTRIC CO·Filed 2002·Granted Dec 6, 2005·12 cites·8 claims
Showing the top 50 of 103 patent records by PatentIndex Score.
Join the waitlist — get patent alerts
Get an alert when Nobuyoshi Shimizu files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →