Inventor · disambiguated record
Nobuhiro Shimizu
Also filed as: SHIMIZU NOBUHIRO
33 granted patents·6 pending applications·474 citations·filing 1981–2018
97Inventor score
Files withSEIKO INSTR INC20MATSUSHITA ELECTRIC INDUSTRIAL CO LTD9OTAKE SHIRO3PANASONIC CORP2CASIO COMPUTER CO LTD1
Top patents by PatentIndex Score
39 records- 0187US6422069B1Self-exciting and self-detecting probe and scanning probe apparatusSEIKO INSTR INC·Filed 2000·Granted Jul 23, 2002·41 cites·15 claims
- 0277US6806647B2Light source device with discontinuous electrode contact portions and liquid crystal displayMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2002·Granted Oct 19, 2004·15 cites·17 claims
- 0373US6667467B2Microprobe and scanning probe apparatus having microprobeSEIKO INSTR INC·Filed 2001·Granted Dec 23, 2003·30 cites·10 claims
- 0471US6469293B1Multiprobe and scanning probe microscopeSEIKO INSTR INC·Filed 2000·Granted Oct 22, 2002·28 cites·27 claims
- 0570US6946796B2Light source device and liquid crystal display employing the sameMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2004·Granted Sep 20, 2005·10 cites·16 claims
- 0670US5877412AProbe for atomic force microscope and atomic force microscopeSEIKO INSTR INC·Filed 1997·Granted Mar 2, 1999·33 cites·25 claims
- 0768US5548130ADC superconducting quantum interference device with shield layerSEIKO INSTR INC·Filed 1994·Granted Aug 20, 1996·30 cites·38 claims
- 0865US7276851B2Discharge lamp device and backlight having external electrode unitMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2003·Granted Oct 2, 2007·7 cites·18 claims
- 0965US6806648B2Light source device and liquid crystal display deviceMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2002·Granted Oct 19, 2004·9 cites·17 claims
- 1065US6664540B2Microprobe and sample surface measuring apparatusSEIKO INSTR INC·Filed 2001·Granted Dec 16, 2003·14 cites·20 claims
- 1164US6611592B1Incoming-call tone generation deviceMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2000·Granted Aug 26, 2003·11 cites·6 claims
- 1262US6383823B1Probe for scanning probe microscope (SPM) and SPM deviceSEIKO INSTR INC·Filed 1999·Granted May 7, 2002·26 cites·40 claims
- 1362US6171437B1Semiconductor manufacturing deviceSEIKO INSTR INC·Filed 1998·Granted Jan 9, 2001·27 cites·24 claims
- 1461US5825183ARadial differential squid magnetic flux meterSEIKO INSTR INC·Filed 1996·Granted Oct 20, 1998·23 cites·13 claims
- 1560US11010603B2Ledger document processing device, ledger document processing method and storage mediumCASIO COMPUTER CO LTD·Filed 2018·Granted May 18, 2021·1 cites·17 claims
- 1659US6211540B1Semiconductor strain sensor and scanning probe microscope using the semiconductor strain sensorSEIKO INSTR INC·Filed 1998·Granted Apr 3, 2001·22 cites·27 claims
- 1756US6891334B2Light source device and liquid crystal display employing the sameMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2002·Granted May 10, 2005·5 cites·14 claims
- 1853US5406201AMagnetic field detecting circuit having a relaxation oscillator SQUIDSEIKO INSTR INC·Filed 1992·Granted Apr 11, 1995·16 cites·4 claims
- 1953US5306521AProcess for manufacturing DC superconducting quantum interference deviceSEIKO INSTR INC·Filed 1992·Granted Apr 26, 1994·15 cites·13 claims
- 2052US6388252B1Self-detecting type of SPM probe and SPM deviceSEIKO INSTR INC·Filed 1998·Granted May 14, 2002·16 cites·15 claims
- 2151US6358426B1Method of fabricating probe force atomic force microscopeSEIKO INSTR INC·Filed 1999·Granted Mar 19, 2002·14 cites·28 claims
- 2251US4487555AHermetic motor compressorMITSUBISHI ELECTRIC CORP·Filed 1981·Granted Dec 11, 1984·15 cites·18 claims
- 2347US6906461B2Light source device with inner and outer electrodes and liquid crystal display deviceMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2002·Granted Jun 14, 2005·2 cites·10 claims
- 2447US2009262278A1External electrode lamp, backlight unit, and liquid crystal displaySHIMIZU NOBUHIRO·Filed 2006·Application pending·0 cites
- 2546US6405583B1Correlation sample for scanning probe microscope and method of processing the correlation sampleSEIKO INSTR INC·Filed 1999·Granted Jun 18, 2002·16 cites·18 claims
- 2646US6049115AScanning probe microscope, and semiconductor distortion sensor for use thereinSEIKO INSTR INC·Filed 1997·Granted Apr 11, 2000·12 cites·25 claims
- 2745US6903518B2Discharge lamp device and backlight using the sameMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2003·Granted Jun 7, 2005·1 cites·20 claims
- 2845US5992225ACantilever probe and scanning type probe microscope utilizing the cantilever probeSEIKO INSTR INC·Filed 1997·Granted Nov 30, 1999·10 cites·34 claims
- 2945US2010072873A1Hot-cathode fluorescent lampOTAKE SHIRO·Filed 2007·Application pending·0 cites
- 3045US2010060128A1Hot cathode fluorescent lampOTAKE SHIRO·Filed 2007·Application pending·0 cites
- 3144US5231353AApparatus for detecting a fine magnetic field with a signal adjusting circuit in a dc squidSEIKO INSTR INC·Filed 1992·Granted Jul 27, 1993·11 cites·21 claims
- 3243US7619361B2Discharge lamp device including an airtight container filled with a noble gasPANASONIC CORP·Filed 2005·Granted Nov 17, 2009·0 cites·17 claims
- 3343US7282861B2Light source device, lighting device and liquid crystal display deviceMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2006·Granted Oct 16, 2007·0 cites·15 claims
- 3443US2010134004A1Hot-cathode fluorescent lampOTAKE SHIRO·Filed 2007·Application pending·0 cites
- 3542US7495376B2Light source device, lighting device, and liquid crystal display devicePANASONIC CORP·Filed 2004·Granted Feb 24, 2009·0 cites·18 claims
- 3641US6176122B1Cantilever unit and scanning probe microscope utilizing the cantilever unitSEIKO INSTR INC·Filed 1998·Granted Jan 23, 2001·8 cites·25 claims
- 3739US2012097523A1Method and system for purifying siliconMORI NOBUYUKI·Filed 2010·Application pending·0 cites
- 3835US2002030437A1Light-emitting device and backlight for flat displayFiled 2001·Application pending·0 cites
- 3932US5173659AHighly sensitive magnetic field detecting SQUID with dual demodulation circuitSEIKO INSTR INC·Filed 1991·Granted Dec 22, 1992·6 cites·10 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →