Inventor · disambiguated record
Norihiko Shishido
Also filed as: SHISHIDO NORIHIKO
4 granted patents·2 pending applications·13 citations·filing 1996–2022
68Inventor score
Top patents by PatentIndex Score
6 records- 0139US2008206907A1Method for fabricating semiconductor device to which test is performed at wafer level and apparatus for testing semiconductor deviceSHISHIDO NORIHIKO·Filed 2007·Application pending·0 cites
- 0237US5777375ASemiconductor device improved in a structure of an L-PNP transistorTOSHIBA KK·Filed 1996·Granted Jul 7, 1998·8 cites·2 claims
- 0336US2008093722A1Encapsulation type semiconductor device and manufacturing method thereofSHISHIDO NORIHIKO·Filed 2007·Application pending·0 cites
- 0434US6156622ABipolar transistor having isolation regionsTOSHIBA KK·Filed 2000·Granted Dec 5, 2000·1 cites·4 claims
- 0528US6064106ABipolar transistor having isolation regionsTOSHIBA KK·Filed 1997·Granted May 16, 2000·4 cites·8 claims
- 0626USD1023312SHemostatic agent materialG C DENTAL IND CORP·Filed 2022·Granted Apr 16, 2024·0 cites·1 claims
Join the waitlist — get patent alerts
Get an alert when Norihiko Shishido files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →