Inventor · disambiguated record
Nobuaki Takeuchi
Also filed as: TAKEUCHI NOBUAKI
22 granted patents·1 pending application·305 citations·filing 1992–2015
95Inventor score
Top patents by PatentIndex Score
23 records- 0186US6028661AMulti-branched optical line testing apparatusANDO ELECTRIC·Filed 1997·Granted Feb 22, 2000·57 cites·5 claims
- 0285US6512610B1Device and method for testing of multi-branch optical networkANDO ELECTRIC·Filed 1999·Granted Jan 28, 2003·53 cites·12 claims
- 0369US6310702B1Testing device for multistage multi-branch optical networkANDO ELECTRIC·Filed 1998·Granted Oct 30, 2001·44 cites·7 claims
- 0469US5309455AHigh-power light pulse generating apparatusANDO ELECTRIC·Filed 1992·Granted May 3, 1994·34 cites·4 claims
- 0567US6473556B1Apparatus for inspecting integrated circuitsANDO ELECTRIC·Filed 2000·Granted Oct 29, 2002·11 cites·12 claims
- 0660US6486952B2Semiconductor test apparatusANDO ELECTRIC·Filed 2001·Granted Nov 26, 2002·3 cites·11 claims
- 0759US5452071AMethod of measuring optical attenuation using an optical time domain reflectometerANDO ELECTRIC·Filed 1994·Granted Sep 19, 1995·21 cites·4 claims
- 0853US6567760B1Electro-optic sampling oscilloscopeANDO ELECTRIC·Filed 1999·Granted May 20, 2003·17 cites·23 claims
- 0948US6505312B1Integrated circuit testerANDO ELECTRIC·Filed 2000·Granted Jan 7, 2003·6 cites·5 claims
- 1048US6201235B1Electro-optic sampling oscilloscopeANDO ELECTRIC·Filed 1999·Granted Mar 13, 2001·14 cites·20 claims
- 1147US6384590B1Light receiving circuit for use in electro-optic sampling oscilloscopeANDO ELECTRIC·Filed 1999·Granted May 7, 2002·13 cites·3 claims
- 1244US6766483B2Semiconductor test apparatusANDO ELECTRIC·Filed 2001·Granted Jul 20, 2004·4 cites·10 claims
- 1342US6614252B2Semiconductor test apparatus with reduced power consumption and heat generationANDO ELECTRIC·Filed 2001·Granted Sep 2, 2003·2 cites·7 claims
- 1442US6566896B2Semiconductor testing apparatusANDO ELECTRIC·Filed 2001·Granted May 20, 2003·2 cites·14 claims
- 1541US10018517B2Optical fiber temperature distribution measuring deviceYOKOGAWA ELECTRIC CORP·Filed 2015·Granted Jul 10, 2018·0 cites·5 claims
- 1639US6232765B1Electro-optical oscilloscope with improved samplingANDO ELECTRIC·Filed 1999·Granted May 15, 2001·8 cites·10 claims
- 1736US6310507B1Timing generation circuit for electro-optic sampling oscilloscopeANDO ELECTRIC·Filed 1998·Granted Oct 30, 2001·7 cites·9 claims
- 1834US2002021137A1Method for calibrating a semiconductor testing device, a semiconductor testing apparatus, and a method for testing a semiconductor deviceANDO ELECTRIC·Filed 2001·Application pending·0 cites
- 1931US6288529B1Timing generation circuit for an electro-optic oscilloscopeANDO ELECTRIC·Filed 1999·Granted Sep 11, 2001·4 cites·2 claims
- 2030US6087838ASignal processing circuit for electro-optic probeANDO ELECTRIC·Filed 1998·Granted Jul 11, 2000·2 cites·8 claims
- 2129US6377036B1Electro-optic sampling oscilloscopeANDO ELECTRIC·Filed 1998·Granted Apr 23, 2002·2 cites·5 claims
- 2228US6683447B1Electro-optic apparatus for measuring signal potentialsANDO ELECTRIC·Filed 1998·Granted Jan 27, 2004·0 cites·6 claims
- 2328US6252387B1Oscilloscope utilizing probe with electro-optic crystalANDO ELECTRIC·Filed 1998·Granted Jun 26, 2001·1 cites·17 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →