Inventor · disambiguated record
Nui Chong
Also filed as: CHONG NUI
20 granted patents·5 pending applications·153 citations·filing 2004–2023
94Inventor score
Top patents by PatentIndex Score
25 records- 0198US11119146B1Testing of bonded wafers and structures for testing bonded wafersXILINX INC·Filed 2020·Granted Sep 14, 2021·13 cites·20 claims
- 0297US10692837B1Chip package assembly with modular core diceXILINX INC·Filed 2018·Granted Jun 23, 2020·35 cites·18 claims
- 0396US11650249B1Wafer testing and structures for wafer testingXILINX INC·Filed 2020·Granted May 16, 2023·4 cites·20 claims
- 0493US11054461B1Test circuits for testing a die stackXILINX INC·Filed 2019·Granted Jul 6, 2021·12 cites·18 claims
- 0592US11164749B1Warpage reductionXILINX INC·Filed 2019·Granted Nov 2, 2021·7 cites·19 claims
- 0692US8068004B1Embedded inductorCHONG NUI·Filed 2010·Granted Nov 29, 2011·21 cites·12 claims
- 0789US7673270B1Method and apparatus for compensating an integrated circuit layout for mechanical stress effectsXILINX INC·Filed 2007·Granted Mar 2, 2010·14 cites·19 claims
- 0886US11585854B1Runtime measurement of process variations and supply voltage characteristicsXILINX INC·Filed 2018·Granted Feb 21, 2023·6 cites·19 claims
- 0985US10629512B2Integrated circuit die with in-chip heat sinkXILINX INC·Filed 2018·Granted Apr 21, 2020·4 cites·20 claims
- 1081US9177634B1Two gate pitch FPGA memory cellXILINX INC·Filed 2014·Granted Nov 3, 2015·5 cites·16 claims
- 1180US11114344B1IC die with dummy structuresXILINX INC·Filed 2020·Granted Sep 7, 2021·1 cites·20 claims
- 1280US10756711B1Integrated circuit skew determinationXILINX INC·Filed 2019·Granted Aug 25, 2020·2 cites·20 claims
- 1374US8194372B1Systems and methods for electrostatic discharge protectionCHONG NUI·Filed 2009·Granted Jun 5, 2012·6 cites·18 claims
- 1473US7024646B2Electrostatic discharge simulationLATTICE SEMICONDUCTOR CORP·Filed 2004·Granted Apr 4, 2006·18 cites·22 claims
- 1570US10043724B1Using an integrated circuit die for multiple devicesXILINX INC·Filed 2016·Granted Aug 7, 2018·1 cites·9 claims
- 1660US12045469B2Single event upset tolerant memory deviceXILINX INC·Filed 2022·Granted Jul 23, 2024·0 cites·20 claims
- 1753US2023317529A1Method of testing structures and stacking wafersXILINX INC·Filed 2022·Application pending·0 cites
- 1850US7307319B1High-voltage protection device and processLATTICE SEMICONDUCTOR CORP·Filed 2004·Granted Dec 11, 2007·4 cites·3 claims
- 1947US10379155B2In-die transistor characterization in an ICXILINX INC·Filed 2014·Granted Aug 13, 2019·0 cites·16 claims
- 2047US2024428848A18-t sram bitcell for fpga programmingXILINX INC·Filed 2023·Application pending·0 cites
- 2141US10103139B2Method and design of low sheet resistance MEOL resistorsXILINX INC·Filed 2015·Granted Oct 16, 2018·0 cites·15 claims
- 2238US10566050B1Selectively disconnecting a memory cell from a power supplyXILINX INC·Filed 2018·Granted Feb 18, 2020·0 cites·20 claims
- 2337US2005213271A1Electrostatic discharge protection circuitsCHONG NUI·Filed 2004·Application pending·0 cites
- 2435US2006157748A1Metal junction diode and processCHONG NUI·Filed 2005·Application pending·0 cites
- 2534US2006125014A1Diode with low junction capacitanceCHONG NUI·Filed 2004·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →