Inventor · disambiguated record

Ofek Oiknine

Also filed as: OIKNINE OFEK

2 granted patents·0 citations·filing 2023–2023

24Inventor score

Technology areasG01N

Files withXWINSYS TECH DEVELOPMENT LTD1 XWINSYS TECH DEVELOPMENTS LTD1

Top patents by PatentIndex Score

2 records

0160US11969276B1Dual head X-ray inspection systemXWINSYS TECH DEVELOPMENT LTD·Filed 2023·Granted Apr 30, 2024·0 cites·20 claims
0254US12050187B1Dual source X-ray inspection system and methodXWINSYS TECH DEVELOPMENTS LTD·Filed 2023·Granted Jul 30, 2024·0 cites·18 claims

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →