Inventor · disambiguated record
Oksana Kryachek
Also filed as: KRYACHEK OKSANA
19 granted patents·4 pending applications·113 citations·filing 2006–2022
93Inventor score
Top patents by PatentIndex Score
23 records- 0198US10908207B2Systems and methods for conforming device testers to integrated circuit device with pressure relief valveESSAI INC·Filed 2016·Granted Feb 2, 2021·31 cites·4 claims
- 0298US10126356B2Systems and methods for conforming test tooling to integrated circuit device with whirlwind cold plateESSAI INC·Filed 2016·Granted Nov 13, 2018·30 cites·17 claims
- 0396US11378588B2Contactor with angled depressible probes in shifted boresESSAI INC·Filed 2020·Granted Jul 5, 2022·3 cites·10 claims
- 0489US10481175B2Contactor with angled depressible probesESSAI INC·Filed 2017·Granted Nov 19, 2019·3 cites·22 claims
- 0587US9804223B2Systems and methods for conforming test tooling to integrated circuit device with heater socketESSAI INC·Filed 2015·Granted Oct 31, 2017·4 cites·19 claims
- 0684US8493085B2Spring contact pin for an ic test socket and the likeBARABI NASSER·Filed 2010·Granted Jul 23, 2013·6 cites·11 claims
- 0781US11293976B1Integrated circuit device test tooling with dual angle cavitiesESSAI INC·Filed 2020·Granted Apr 5, 2022·1 cites·7 claims
- 0880US7651340B2Chip actuator cover assemblyESSAI INC·Filed 2008·Granted Jan 26, 2010·10 cites·29 claims
- 0979US9007080B2Systems and methods for conforming device testers to integrated circuit device profiles with feedback temperature controlESSAI INC·Filed 2013·Granted Apr 14, 2015·4 cites·11 claims
- 1076US9766268B2Contactor with angled spring probesBARABI NASSER·Filed 2007·Granted Sep 19, 2017·8 cites·22 claims
- 1175US8653842B2Systems and methods for thermal control of integrated circuits during testingBARABI NASSER·Filed 2011·Granted Feb 18, 2014·2 cites·9 claims
- 1273US9383406B2Systems and methods for conforming device testers to integrated circuit device with pressure relief valveESSAI INC·Filed 2014·Granted Jul 5, 2016·2 cites·3 claims
- 1372US2022413010A1Contactor with angled depressible probes in shifted boresESSAI INC·Filed 2022·Application pending·0 cites
- 1470US8981802B2Systems and methods for conforming device testers to integrated circuit device profilesBARABI NASSER·Filed 2012·Granted Mar 17, 2015·3 cites·11 claims
- 1568US9494642B2Systems and methods for conforming test tooling to integrated circuit device profiles with ejection mechanismsESSAI INC·Filed 2013·Granted Nov 15, 2016·2 cites·8 claims
- 1667US2020225264A1Contactor with angled depressible probesESSAI INC·Filed 2019·Application pending·0 cites
- 1763US7583097B2Contactor nest for an IC device and methodESSAI INC·Filed 2006·Granted Sep 1, 2009·4 cites·21 claims
- 1852US9557373B2Systems and methods for conforming test tooling to integrated circuit device profiles with convex support structureESSAI INC·Filed 2014·Granted Jan 31, 2017·0 cites·12 claims
- 1948US11906550B2Probe system for QFP integrated circuit device test toolingESSAI INC·Filed 2021·Granted Feb 20, 2024·0 cites·6 claims
- 2046US9229049B2Systems and methods for conforming test tooling to integrated circuit device profiles with compliant pedestalsESSAI INC·Filed 2013·Granted Jan 5, 2016·0 cites·12 claims
- 2145US2015022226A1Systems and methods for conforming test tooling to integrated circuit device profiles with coaxial socketESSAI INC·Filed 2014·Application pending·0 cites
- 2243US9279852B2Systems and methods for conforming test tooling to integrated circuit device profiles with sockets having secured and replaceable bushingsESSAI INC·Filed 2013·Granted Mar 8, 2016·0 cites·2 claims
- 2337US2007018666A1Spring contact pin for an IC chip testerBARABI NASSER·Filed 2006·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Oksana Kryachek files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →