Inventor · disambiguated record
Oleg Y. Komkov
Also filed as: KOMKOV OLEG Y
2 granted patents·1 pending application·50 citations·filing 2000–2002
63Inventor score
Files withKOREA INST SCI & TECH2
Top patents by PatentIndex Score
3 records- 0179US6441371B1Scanning probe microscopeKOREA INST SCI & TECH·Filed 2000·Granted Aug 27, 2002·39 cites·16 claims
- 0268US6615640B2Fine friction and wear test apparatus for plate specimenKOREA INST SCI & TECH·Filed 2002·Granted Sep 9, 2003·11 cites·20 claims
- 0332US2002062678A1Fine friction and wear testing apparatusFiled 2001·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →