Inventor · disambiguated record
Olaf Kuehn
Also filed as: KUEHN OLAF
7 granted patents·1 pending application·5 citations·filing 2003–2019
75Inventor score
Files withINFINEON TECHNOLOGIES AG3TRIMBLE JENA GMBH2INFINEON TECHNOLOGIES AKTIENTG1INFINEON TECHNOLOGIES AUSTRIA AG1ZIMMER JUERGEN1
Top patents by PatentIndex Score
8 records- 0172US9606197B2XMR sensors with high shape anisotropyINFINEON TECHNOLOGIES AG·Filed 2015·Granted Mar 28, 2017·1 cites·5 claims
- 0263US9146287B2XMR sensors with high shape anisotropyZIMMER JUERGEN·Filed 2010·Granted Sep 29, 2015·1 cites·10 claims
- 0355US9915707B2XMR sensors with high shape anisotropyINFINEON TECHNOLOGIES AG·Filed 2017·Granted Mar 13, 2018·0 cites·13 claims
- 0443US7496471B2Surveying apparatus and method of analyzing measuring dataTRIMBLE JENA GMBH·Filed 2007·Granted Feb 24, 2009·0 cites·11 claims
- 0542US2020111896A1Transistor Device and Method for Forming a Recess for a Trench Gate ElectrodeINFINEON TECHNOLOGIES AUSTRIA AG·Filed 2019·Application pending·0 cites
- 0640US7246034B2Surveying apparatus and method of analyzing measuring dataTRIMBLE JENA GMBH·Filed 2005·Granted Jul 17, 2007·0 cites·26 claims
- 0738US6932674B2Method of determining the endpoint of a planarization processINFINEON TECHNOLOGIES AKTIENTG·Filed 2003·Granted Aug 23, 2005·3 cites·34 claims
- 0834US6827635B2Method of planarizing substratesINFINEON TECHNOLOGIES AG·Filed 2003·Granted Dec 7, 2004·0 cites·35 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →